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“
An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data
”. Ro C-U, Kim HK, Van Grieken R, Analytical chemistry
76
, 1322 (2004). http://doi.org/10.1021/AC035149I
Keywords:
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI:
10.1021/AC035149I
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