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“Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam”. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy 231, 359 (2008). http://doi.org/10.1111/j.1365-2818.2008.02055.x
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