|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I.; Callant, P. |
Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry |
2001 |
Langmuir |
17 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
Accurate ab initio quartic force fields and thermochemistry of FNO and CINO |
1994 |
The journal of physical chemistry |
98 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. |
Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions |
1998 |
Analytical chemistry |
70 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Poels, K.; van Vaeck, L.; Gijbels, R. |
Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry |
1998 |
Analytical chemistry |
70 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Two-dimensional model of a direct current glow discharge : description of the argon metastable atoms, sputtered atoms and ions |
1996 |
Analytical chemistry |
68 |
57 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R.; Goedheer, W.J. |
Two-dimensional model of a direct current glow discharge: description of the electrons, argon ions and fast argon atoms |
1996 |
Analytical chemistry |
68 |
70 |
UA library record; WoS full record; WoS citing articles |
|
|
Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields |
2004 |
Analytical chemistry |
76 |
67 |
UA library record; WoS full record; WoS citing articles |
|
|
Vertes, A.; Irinyi, G.; Gijbels, R. |
Hydrodynamic model of matrix-assisted laser desorption mass spectrometry |
1993 |
Analytical chemistry |
65 |
100 |
UA library record; WoS full record; WoS citing articles |
|
|
van Straaten, M.; Gijbels, R.; Vertes, A. |
Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell |
1992 |
Analytical chemistry |
64 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. |
Molecular speciation of inorganic mixtures by Fourier transform laser microprobe mass sepctrometry |
2003 |
International journal of mass spectrometry |
225 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
1999 |
Journal of the American Society for Mass Spectrometry |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of glow discharge sources with flat and pin cathodes and implications for mass spectrometric analysis |
1997 |
Journal of the American Society of Mass Spectrometry |
8 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Analytical electron microscopy of silver halide photographic systems |
2000 |
Micron |
31 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
Oleshko, V.P.; van Daele, A.; Gijbels, R.H.; Jacob, W.A. |
Structural and analytical characterization of Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
Journal of nanostructured materials |
10 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Volkov, V.V.; van Landuyt, J.; Marushkin, K.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
LPE growth and characterization of InGaAsP/InP heterostructures: IR-emitting diodes at 1.66 μm: application to the remote monitoring of methane gas |
1997 |
Sensors and actuators : A : physical |
62 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Comparison between a radio-frequency and direct current glow discharge in argon by a hybrid Monte Carlo-fluid model for electrons, argon ions and fast argon atoms |
1999 |
Spectrochimica acta: part B : atomic spectroscopy |
54 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R.; Carman, R.J. |
Collisional-radiative model for the sputtered copper atoms and ions in a direct current argon glow discharge |
1998 |
Spectrochimica acta: part B : atomic spectroscopy |
53 |
71 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R.; Vlcek, J. |
Modeling of glow discharge optical emission spectrometry: calculation of the argon atomic optical emission spectrum |
1998 |
Spectrochimica acta: part B : atomic spectroscopy |
53 |
44 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Comprehensive description of a Grimm-type glow discharge source used for optical emission spectrometry: a mathematical simulation |
1998 |
Spectrochimica acta: part B : atomic spectroscopy |
53 |
46 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Fundamental aspects and applications of glow discharge spectrometric techniques |
1998 |
Spectrochimica acta: part B : atomic spectroscopy |
53 |
49 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Hybrid Monte-Carlo-fluid modeling network for an argon/hydrogen direct current glow discharge |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
68 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Neyts, E.; Gijbels, R.; van der Mullen, J. |
Gas discharge plasmas and their applications |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
462 |
UA library record; WoS full record; WoS citing articles |
|
|
Baguer, N.; Bogaerts, A.; Gijbels, R. |
Hybrid model for a cylindrical hollow cathode glow discharge and comparison with experiments |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Wilken, L.; Hoffmann, V.; Gijbels, R.; Wetzig, K. |
Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Wilken, L.; Hoffmann, V.; Gijbels, R.; Wetzig, K. |
Comparison of modeling calculations with experimental results for direct current glow discharge optical emission spectrometry |
2001 |
Spectrochimica acta: part B : atomic spectroscopy |
56 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Description of the argon-excited levels in a radio-frequency and direct current glow discharge |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Behavior of the sputtered copper atoms, ions and excited species in a radio-frequency and direct current glow discharge |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals |
2003 |
Applied surface science |
203/204 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks |
2003 |
Applied surface science |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
|