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“IDAS: a new Windows based software for multivariate analysis of atmospheric aerosol composition data bases”. Bondarenko I, Treiger B, Van Grieken R, van Espen P page 308 (1995).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
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“IDAS: a Windows based software package for cluster analysis”. Bondarenko I, Treiger B, Van Grieken R, van Espen P, Spectrochimica acta: part B : atomic spectroscopy 51, 441 (1996)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
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“Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium)”. Vandevijvere M, Van de Voorde L, Caen J, van Espen P, Vekemans B, Vincze L, Schalm O page 169 (2013).
Keywords: H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES)
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“Morphology and fractal dimension of soot and carbon black aggregates determined by image analysis”. Smekens A, Vervoort M, Pauwels J, Berghmans P, van Espen P, Van Grieken R, (1998)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
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“Multiscale modeling of radiation damage and annealing in Si samples implanted with 57-Mn radioactive ions”. Abreu Y, Cruz CM, van Espen P, Piñera I, Leyva A, Cabal AE, IEEE conference record
T2 –, IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN , 1754 (2011)
Abstract: The radiation damage created in silicon materials by Mn-57 -> Fe-57 ion implantation has been studied and characterized by Mossbauer spectroscopy showing four main lines, assigned to: substitutional, interstitial and damaged configuration sites of the implanted ions. Nevertheless, the Mossbauer spectrum of Fe-57 in this materials remains with some ambiguous identification regarding the implantation configurations before and after annealing, specially the damaged configurations and its evolution. In the present work some possible implantation configurations are suggested and evaluated using a multiscale approach by Monte Carlo ion transport and electronic structure calculations within DFT. The proposed implantation environments were evaluated in terms of stability and the Fe-57 hyperfine parameters were calculated to establish the connections with the experimental observations. Good agreement was found between the experimental and the calculated hyperfine parameters for some configurations; suggesting which ones could be the implantation environments before and after sample annealing.
Keywords: P1 Proceeding; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Prediction of Mα/L&alpha, intensity ratios and the use in the spectra evaluation”. Trincavelli J, Montoro S, Van Grieken R, van Espen P, (1992)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
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“Radiation damage evaluation on LYSO and LuYAP materials through Dpa calculation assisted by Monte Carlo method”. Piñera I, Abreu Y, van Espen P, Diaz A, Leyva A, Cruz CM, IEEE conference record
T2 –, IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN , 1609 (2011)
Abstract: The aim of the present work is to study the radiation damage induced in LYSO and LuYAP crystals by the gamma radiation and the secondary electrons/positrons generated. The displacements per atom (dpa) distributions inside each material were calculated following the Monte Carlo assisted Classical Method (MCCM) introduced by the authors. As gamma sources were used Sc-44, Na-22 and V-48. Also the energy of gammas from the annihilation processes (511 keV) was included in the study. This procedure allowed studying the in-depth dpa distributions inside each crystal for all four sources. It was also possible to obtain the separate contribution from each atom to the total dpa. The LYSO crystals were found to receive more damage, mainly provoked by the displacements of silicon and oxygen atoms.
Keywords: P1 Proceeding; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Study of the main physical processes contributing to image formation in emission radiography using mathematical modeling”. Leyva Pernia D, Cabal Rodríguez AE, Schalm O, van Espen P, Piñera Hernández I, Abreu Alfonso Y, (2013)
Keywords: P3 Proceeding; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES)
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“Sulfur and heavy metals over the Atlantic Ocean : comparison with other marine data”. Maenhaut W, Selen A, van Espen P, Van Grieken R, Winchester JW, (1980)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
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“Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis”. Verlinden G, Janssens G, Gijbels R, van Espen P, Geuens I, Analytical chemistry 69, 3773 (1997). http://doi.org/10.1021/ac970010r
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)
Impact Factor: 6.32
Times cited: 6
DOI: 10.1021/ac970010r
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“Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications”. Van Echelpoel R, de Jong M, Daems D, van Espen P, De Wael K, Talanta 233, 122605 (2021). http://doi.org/10.1016/J.TALANTA.2021.122605
Abstract: Bridging the gap between complex signal data output and clear interpretation by non-expert end-users is a major challenge many scientists face when converting their scientific technology into a real-life application. Currently, pattern recognition algorithms are the most frequently encountered signal data interpretation algorithms to close this gap, not in the least because of their straight-forward implementation via convenient software packages. Paradoxically, just because their implementation is so straight-forward, it becomes cumbersome to integrate the expert's domain-specific knowledge. In this work, a novel signal data interpretation approach is presented that uses this domain-specific knowledge as its fundament, thereby fully exploiting the unique expertise of the scientist. The new approach applies data preprocessing in an innovative way that transcends its usual purpose and is easy to translate into a software application. Multiple case studies illustrate the straight-forward application of the novel approach. Ultimately, the approach is highly suited for integration in various (bio)analytical applications that require interpretation of signal data.
Keywords: A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 4.162
DOI: 10.1016/J.TALANTA.2021.122605
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