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IDAS: a new Windows based software for multivariate analysis of atmospheric aerosol composition data bases”. Bondarenko I, Treiger B, Van Grieken R, van Espen P page 308 (1995).
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IDAS: a Windows based software package for cluster analysis”. Bondarenko I, Treiger B, Van Grieken R, van Espen P, Spectrochimica acta: part B : atomic spectroscopy 51, 441 (1996)
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Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium)”. Vandevijvere M, Van de Voorde L, Caen J, van Espen P, Vekemans B, Vincze L, Schalm O page 169 (2013).
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Morphology and fractal dimension of soot and carbon black aggregates determined by image analysis”. Smekens A, Vervoort M, Pauwels J, Berghmans P, van Espen P, Van Grieken R, (1998)
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Multiscale modeling of radiation damage and annealing in Si samples implanted with 57-Mn radioactive ions”. Abreu Y, Cruz CM, van Espen P, Piñera I, Leyva A, Cabal AE, IEEE conference record T2 –, IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN , 1754 (2011)
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Prediction of Mα/L&alpha, intensity ratios and the use in the spectra evaluation”. Trincavelli J, Montoro S, Van Grieken R, van Espen P, (1992)
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Radiation damage evaluation on LYSO and LuYAP materials through Dpa calculation assisted by Monte Carlo method”. Piñera I, Abreu Y, van Espen P, Diaz A, Leyva A, Cruz CM, IEEE conference record T2 –, IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN , 1609 (2011)
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Study of the main physical processes contributing to image formation in emission radiography using mathematical modeling”. Leyva Pernia D, Cabal Rodríguez AE, Schalm O, van Espen P, Piñera Hernández I, Abreu Alfonso Y, (2013)
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Sulfur and heavy metals over the Atlantic Ocean : comparison with other marine data”. Maenhaut W, Selen A, van Espen P, Van Grieken R, Winchester JW, (1980)
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Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis”. Verlinden G, Janssens G, Gijbels R, van Espen P, Geuens I, Analytical chemistry 69, 3773 (1997). http://doi.org/10.1021/ac970010r
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Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications”. Van Echelpoel R, de Jong M, Daems D, van Espen P, De Wael K, Talanta 233, 122605 (2021). http://doi.org/10.1016/J.TALANTA.2021.122605
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