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Linking a completely three-dimensional nanostrain to a structural transformation eigenstrain”. Tirry W, Schryvers D, Nature materials 8, 752 (2009). http://doi.org/10.1038/NMAT2488
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Hepatocellular transport and gastrointestinal absorption of lanthanum in chronic renal failure”. Bervoets ARJ, Behets GJ, Schryvers D, Roels F, Yang Z, Verberckmoes SC, Damment SJP, Dauwe S, Mubiana VK, Blust R, de Broe ME, d' Haese PC, Kidney international 75, 389 (2009). http://doi.org/10.1038/ki.2008.571
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Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism”. Poulain R, Lumbeeck G, Hunka J, Proost J, Savolainen H, Idrissi H, Schryvers D, Gauquelin N, Klein A, ACS applied electronic materials 4, 2718 (2022). http://doi.org/10.1021/ACSAELM.2C00230
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Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM”. Grieten E, Caen J, Schryvers D, Microscopy and microanalysis 20, 1585 (2014). http://doi.org/10.1017/S1431927614012860
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Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy”. Lu J, Roeffaers MBJ, Bartholomeeusen E, Sels BF, Schryvers D, Microscopy and microanalysis 20, 42 (2014). http://doi.org/10.1017/S1431927613013731
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Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study”. Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin J-P, Pardoen T, Van Tendeloo G, Schryvers D, Microscopy and microanalysis 17, 983 (2011). http://doi.org/10.1017/S143192761101213X
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High-quality sample preparation by low kV FIB thinning for analytical TEM measurements”. Bals S, Tirry W, Geurts R, Yang Z, Schryvers D, Microscopy and microanalysis 13, 80 (2007). http://doi.org/10.1017/S1431927607070018
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On the crystal structure of TiNi-Cu martensite”. Potapov P, Shelyakov A, Schryvers D, Scripta materialia 44, 1 (2001). http://doi.org/10.1016/S1359-6462(00)00555-8
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TEM investigation of the microstructure and defects of CuZr martensite: 2: planar defects”. Seo JW, Schryvers D, Acta materialia 46, 1177 (1998). http://doi.org/10.1016/S1359-6454(97)00334-0
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TEM investigation of the microstructure and defects of CuZr martensite: 1: morphology and twin systems”. Seo JW, Schryvers D, Acta materialia 46, 1165 (1998). http://doi.org/10.1016/S1359-6454(97)00333-9
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Nano-structures at martensite macrotwin interfaces in Ni65Al35”. Boullay P, Schryvers D, Ball JM, Acta materialia 51, 1421 (2003). http://doi.org/10.1016/S1359-6454(02)00536-0
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GP-zones in Al-Zn-Mg alloys and their role in artificial aging”. Berg LK, Gjønnes J, Hansen V, Li XZ, Knutson-Wedel M, Waterloo G, Schryvers D, Wallenberg LR, Acta materialia 49, 3443 (2001). http://doi.org/10.1016/S1359-6454(01)00251-8
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Nanoscale inhomogeneities in melt-spun Ni-Al”. Potapov PL, Ochin P, Pons J, Schryvers D, Acta materialia 48, 3833 (2000). http://doi.org/10.1016/S1359-6454(00)00188-9
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Recrystallization and grain growth in a B2 iron aluminide alloy”. Samajdar I, Ratchev P, Verlinden B, Schryvers D, Intermetallics 6, 419 (1998). http://doi.org/10.1016/S0966-9795(97)00092-7
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Austenite and martensite microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Intermetallics 6, 427 (1998). http://doi.org/10.1016/S0966-9795(97)00091-5
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Phase transformations and precipitation in amorphous Ti50Ni25Cu25 ribbons”. Satto C, Ledda A, Potapov P, Janssens JF, Schryvers D, Intermetallics 9, 395 (2001). http://doi.org/10.1016/S0966-9795(01)00015-2
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High resolution transmission electron microscopy study of nanoscale Ni-rich Ni-Al films evaporated onto NaCl and KCl”. Yandouzi M, Toth L, Schryvers D, Nanostructured materials 10, 99 (1998). http://doi.org/10.1016/S0965-9773(98)00025-7
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Martensitic transformations and microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275, 697 (1999). http://doi.org/10.1016/S0921-5093(99)00399-8
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Measuring the absolute position of EELS ionisation edges in a TEM”. Potapov PL, Schryvers D, Ultramicroscopy 99, 73 (2004). http://doi.org/10.1016/S0304-3991(03)00185-2
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Oscillating sliding wear of mono- and multilayer ceramic coatings in air”. Huq MZ, Celis JP, Meneve J, Stals L, Schryvers D, Surface and coatings technology 113, 242 (1999). http://doi.org/10.1016/S0257-8972(99)00009-2
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Nanohardness and structure of nitrogen implanted SixAly coatings post-implanted with oxygen”. Jacobs M, Bodart F, Terwagne G, Schryvers D, Poulet A, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 147, 231 (1999). http://doi.org/10.1016/S0168-583X(98)00535-7
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Landscape roughness at an atomic scale”. Van Tendeloo G, De Meulenaere P, Schryvers D, Physica: D : nonlinear phenomena 107, 401 (1997). http://doi.org/10.1016/S0167-2789(97)00108-5
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TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film”. Schryvers D, Yandouzi M, Toth L, Thin solid films : an international journal on the science and technology of thin and thick films 326, 126 (1998). http://doi.org/10.1016/S0040-6090(98)00545-8
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Structure refinement of L21 Cu-Zn-Al austenite, using dynamical electron diffraction data”. Satto S, Jansen J, Lexcellent C, Schryvers D, Solid state communications 116, 273 (2000). http://doi.org/10.1016/S0038-1098(00)00316-1
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Defects and growth mechanisms of AgCl(100) tabular crystals”. van Renterghem W, Goessens C, Schryvers D, van Landuyt J, Verrept P, Bollen D, van Roost C, de Keyzer R, Journal of crystal growth 187, 410 (1998). http://doi.org/10.1016/S0022-0248(98)00004-9
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Microstructures and interfaces in Ni-Al martensite: comparing HRTEM observations with continuum theories”. Schryvers D, Boullay P, Potapov PL, Kohn RV, Ball JM, International journal of solids and structures 39, 3543 (2002). http://doi.org/10.1016/S0020-7683(02)00167-1
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Tomographic spectroscopic imaging, an experimental proof of concept”. van den Broek W, Verbeeck J, Schryvers D, de Backer S, Scheunders P, Ultramicroscopy 109, 296 (2009). http://doi.org/10.1016/j.ultramic.2008.11.022
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Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
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Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films”. Amin-Ahmadi B, Idrissi H, Galceran M, Colla MS, Raskin JP, Pardoen T, Godet S, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films 539, 145 (2013). http://doi.org/10.1016/j.tsf.2013.05.083
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Revealing the innermost nanostructure of sputtered NiCrOx solar absorber cermets”. Gaouyat L, He Z, Colomer J-F, Lambin P, Mirabella F, Schryvers D, Deparis O, Solar energy materials and solar cells 122, 303 (2014). http://doi.org/10.1016/j.solmat.2013.10.009
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