Number of records found: 8872
 | 
Citations
 | 
   web
Carrier transport in a two-dimensional topological insulator nanoribbon in the presence of vacancy defects”. Tiwari S, Van de Put ML, Sorée B, Vandenberghe WG, International Conference on Simulation of Semiconductor Processes and Devices : [proceedings] T2 –, International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 24-26, 2018, Austin, TX , 92 (2018). http://doi.org/10.1109/SISPAD.2018.8551720
toggle visibility
Getting rid of anti-solvents: gas quenching for high performance perovskite solar cells”. Conings B, Babayigit A, Klug M, Bai S, Gauquelin N, Sakai N, Wang JT-W, Verbeeck J, Boyen H-G, Snaith H, 2018 Ieee 7th World Conference On Photovoltaic Energy Conversion (wcpec)(a Joint Conference Of 45th Ieee Pvsc, 28th Pvsec &, 34th Eu Pvsec) (2018). http://doi.org/10.1109/PVSC.2018.8547987
toggle visibility
Design of irregularly shaped lens antennas including supershaped feed”. Mescia L, Lamacchia CM, Chiapperino MA, Bia P, Gielis J, Caratelli D, Progress in Electromagnetic Research Symposium (PIERS) T2 –, 2019 PhotonIcs &, Electromagnetics Research Symposium –, Spring (PIERS-Spring), 17-20 June, 2019, Rome, Italy , 169 (2019). http://doi.org/10.1109/PIERS-SPRING46901.2019.9017900
toggle visibility
Relevance of the cell membrane modelling for accurate analysis of the pulsed electric field-induced electroporation”. Mescia L, Chiapperino MA, Bia P, Lamacchia CM, Gielis J, Caratelli D, Progress in Electromagnetic Research Symposium (PIERS) T2 –, 2019 PhotonIcs &, Electromagnetics Research Symposium –, Spring (PIERS-Spring), 17-20 June 2019, Rome, Italy , 2985 (2019). http://doi.org/10.1109/PIERS-SPRING46901.2019.9017456
toggle visibility
Multiphysics modelling of membrane electroporation in irregularly shaped cells”. Mescia L, Chiapperino MA, Bia P, Lamacchia CM, Gielis J, Caratelli D, Progress in Electromagnetic Research Symposium (PIERS) T2 –, 2019 PhotonIcs &, Electromagnetics Research Symposium –, Spring (PIERS-Spring), 17-20 June 2019, Rome, Italy , 2992 (2019). http://doi.org/10.1109/PIERS-SPRING46901.2019.9017428
toggle visibility
Large variation in temperature dependence of band-to-band tunneling current in tunnel devices”. Bizindavyi J, Verhulst AS, Verreck D, Sorée B, Groeseneken G, IEEE electron device letters 40, 1864 (2019). http://doi.org/10.1109/LED.2019.2939668
toggle visibility
Modeling of edge scattering in graphene interconnects”. Contino A, Ciofi I, Wu X, Asselberghs I, Celano U, Wilson CJ, Tokei Z, Groeseneken G, Sorée B, IEEE electron device letters 39, 1085 (2018). http://doi.org/10.1109/LED.2018.2833633
toggle visibility
Intrinsic tailing of resistive states distributions in amorphous <tex>HfOx </tex>, and TaOx based resistive random access memories”. Clima S, Chen YY, Fantini A, Goux L, Degraeve R, Govoreanu B, Pourtois G, Jurczak M, IEEE electron device letters 36, 769 (2015). http://doi.org/10.1109/LED.2015.2448731
toggle visibility
Superior reliability of junctionless pFinFETs by reduced oxide electric field”. Toledano-Luque M, Matagne P, Sibaja-Hernandez A, Chiarella T, Ragnarsson L-A, Sorée B, Cho M, Mocuta A, Thean A, IEEE electron device letters 35, 1179 (2014). http://doi.org/10.1109/LED.2014.2361769
toggle visibility
Determination of ultimate leakage through rutile TiO2 and tetragonal ZrO2 from ab initio complex band calculations”. Clima S, Kaczer B, Govoreanu B, Popovici M, Swerts J, Verhulst AS, Jurczak M, De Gendt S, Pourtois G, IEEE electron device letters 34, 402 (2013). http://doi.org/10.1109/LED.2013.2238885
toggle visibility
Temperature-dependent modeling and characterization of through-silicon via capacitance”. Katti G, Stucchi M, Velenis D, Sorée B, de Meyer K, Dehaene W, IEEE electron device letters 32, 563 (2011). http://doi.org/10.1109/LED.2011.2109052
toggle visibility
Low Loss Atomic Layer Deposited Al2O3 Waveguides for Applications in On-Chip Optical Amplifiers”. Demirtas M, Odaci C, Perkgoz NK, Sevik C, Ay F, IEEE journal of selected topics in quantum electronics 24, 3100508 (2018). http://doi.org/10.1109/JSTQE.2018.2825880
toggle visibility
A multisensor hyperspectral benchmark dataset for unmixing of intimate mixtures”. Koirala B, Rasti B, Bnoulkacem Z, de Lima Ribeiro A, Madriz Y, Herrmann E, Gestels A, De Kerf T, Lorenz S, Fuchs M, Janssens K, Steenackers G, Gloaguen R, Scheunders P, IEEE sensors journal 24, 4694 (2024). http://doi.org/10.1109/JSEN.2023.3343552
toggle visibility
Anisotropic etching of CVD grown graphene for ammonia sensing”. Yagmurcukardes N, Bayram A, Aydin H, Yagmurcukardes M, Acikbas Y, Peeters FM, Celebi C, IEEE sensors journal 22, 3888 (2022). http://doi.org/10.1109/JSEN.2022.3146220
toggle visibility
FLCS-PON : a 100 Gbit/s flexible passive optical network: concepts and field trial”. Borkowski R, Straub M, Ou Y, Lefevre Y, Jelić, ŽL, Lanneer W, Kaneda N, Mahadevan A, Hueckstaedt V, van Veen D, Houtsma V, Coomans W, Bonk R, Maes J, Journal Of Lightwave Technology 39, 5314 (2021). http://doi.org/10.1109/JLT.2021.3102383
toggle visibility
Reliability of copper dual damascene influenced by pre-clean”. Tokei Z, Lanckmans F, van den Bosch G, Van Hove M, Maex K, Bender H, Hens S, van Landuyt J, Analysis Of Integrated Circuits , 118 (2002). http://doi.org/10.1109/IPFA.2002.1025629
toggle visibility
High resolution electron microscopy from imaging towards measuring”. Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3. Ieee, page 2081 (2001).
toggle visibility
Ultrascaled graphene-capped interconnects : a quantum mechanical study”. Reyntjens P, Van de Put M, Vandenberghe WG, Sorée B, Proceedings of the IEEE ... International Interconnect Technology Conference T2 –, IEEE International Interconnect Technology Conference (IITC) / IEEE, Materials for Advanced Metallization Conference (MAM), MAY 22-25, 2023, Dresden, Germany , 1 (2023). http://doi.org/10.1109/IITC/MAM57687.2023.10154656
toggle visibility
Alternative Metals: from ab initio Screening to Calibrated Narrow Line Models”. Adelmann C, Sankaran K, Dutta S, Gupta A, Kundu S, Jamieson G, Moors K, Pinna N, Ciofi I, Van Elshocht S, Bommels J, Boccardi G, Wilson CJ, Pourtois G, Tokei Z, Proceedings of the IEEE ... International Interconnect Technology Conference T2 –, IEEE International Interconnect Technology Conference (IITC), JUN 04-07, 2018, Santa Clara, CA , 154 (2018). http://doi.org/10.1109/IITC.2018.8456484
toggle visibility
Ferroelectric switching in FEFET : physics of the atomic mechanism and switching dynamics in HfZrOx, HfO2 with oxygen vacancies and Si dopants”. Clima S, O'Sullivan BJ, Ronchi N, Bardon MG, Banerjee K, Van den Bosch G, Pourtois G, van Houdt J, (2020). http://doi.org/10.1109/IEDM13553.2020.9372117
toggle visibility
A new method to calculate leakage current and its applications for sub-45nm MOSFETs”. Lujan GS, Magnus W, Soree B, Pourghaderi MA, Veloso A, van Dal MJH, Lauwers A, Kubicek S, De Gendt S, Heyns M, De Meyer K, Solid-State Device Research (ESSDERC), European Conference T2 – ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France. Ieee, S.l., page 489 (2005).
toggle visibility
Impact of calibrated band-tails on the subthreshold swing of pocketed TFETs”. Bizindavyi J, Verhulst AS, Sorée B, Groeseneken G, Conference digest T2 –, 76th Device Research Conference (DRC), JUN 24-27, 2018, Santa Barbara, CA (2018). http://doi.org/10.1109/DRC.2018.8442246
toggle visibility
HRTF measurement by means of unsupervised head movements with respect to a single fixed speaker”. Reijniers J, Partoens B, Steckel J, Peremans H, Ieee Access 8, 92287 (2020). http://doi.org/10.1109/ACCESS.2020.2994932
toggle visibility
Monte Carlo model for the argon ions and fast argon atoms in a radio-frequency discharge”. Bogaerts A, Gijbels R, IEEE transactions on plasma science 27, 1406 (1999). http://doi.org/10.1109/27.799819
toggle visibility
Semianalytical description of nonlocal secondary electrons in a radio-frequency capacitively coupled plasma at intermediate pressures”. Berezhnoi S, Kaganovich I, Misina M, Bogaerts A, Gijbels R, IEEE transactions plasma science 27, 1339 (1999). http://doi.org/10.1109/27.799810
toggle visibility
High-resolution X-ray fluorescence microtomography of homogeneous samples”. Simionovici AS, Chukalina M, Schroer C, Drakopoulos M, Snigirev A, Snigireva I, Lengeler B, Janssens K, Adams F, IEEE transactions on nuclear science 47, 2736 (2000). http://doi.org/10.1109/23.901180
toggle visibility
Structure solution and refinement of metal-ion battery cathode materials using electron diffraction tomography”. Hadermann J, Abakumov AM, And Materials 75, 485 (2019). http://doi.org/10.1107/S2052520619008291
toggle visibility
XRDUA : crystalline phase distribution maps by two-dimensional scanning and tomographic (micro) X-ray powder diffraction”. de Nolf W, Vanmeert F, Janssens K, Journal of applied crystallography 47, 1107 (2014). http://doi.org/10.1107/S1600576714008218
toggle visibility
KSm(MoO4)2, an incommensurately modulated and partially disordered scheelite-like structure”. Arakcheeva A, Pattison P, Chapuis G, Rossell M, Filaretov A, Morozov V, Van Tendeloo G, Acta crystallographica: section B: structural science 64, 160 (2008). http://doi.org/10.1107/S0108768108001870
toggle visibility
Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48”. Tirry W, Schryvers D, Jorissen K, Lamoen D, Acta crystallographica: section B: structural science 62, 966 (2006). http://doi.org/10.1107/S0108768106036457
toggle visibility