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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
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Bittencourt, C.; Hitchock, A.P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Guttmann, P. |
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge |
2012 |
Beilstein journal of nanotechnology |
3 |
15 |
UA library record; WoS full record; WoS citing articles |
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Bittencourt, C.; Krüger, P.; Lagos, M.J.; Ke, X.; Van Tendeloo, G.; Ewels, C.; Umek, P.; Guttmann, P. |
Towards atomic resolution in sodium titanate nanotubes using near-edge X-ray-absorption fine-structure spectromicroscopy combined with multichannel multiple-scattering calculations |
2012 |
Beilstein journal of nanotechnology |
3 |
13 |
UA library record; WoS full record; WoS citing articles |
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Ke, X.; Bittencourt, C.; Bals, S.; Van Tendeloo, G. |
Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM |
2013 |
Beilstein journal of nanotechnology |
4 |
12 |
UA library record; WoS full record; WoS citing articles |
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Ke, X.; Bittencourt, C.; Van Tendeloo, G. |
Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials |
2015 |
Beilstein journal of nanotechnology |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
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