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Author Title Year Publication Volume Times cited Additional Links
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles
Friedrich, T.; Yu, C.-P.; Verbeek, J.; Pennycook, T.; Van Aert, S. Phase retrieval from 4-dimensional electron diffraction datasets 2021 Proceedings T2 – IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network UA library record; WoS full record; WoS citing articles
Monai, M.; Jenkinson, K.; Melcherts, A.E.M.; Louwen, J.N.; Irmak, E.A.; Van Aert, S.; Altantzis, T.; Vogt, C.; van der Stam, W.; Duchon, T.; Smid, B.; Groeneveld, E.; Berben, P.; Bals, S.; Weckhuysen, B.M. Restructuring of titanium oxide overlayers over nickel nanoparticles during catalysis 2023 Science 380 29 UA library record; WoS full record; WoS citing articles
Jones, L.; Yang, H.; Pennycook, T.J.; Marshall, M.S.J.; Van Aert, S.; Browning, N.D.; Castell, M.R.; Nellist, P.D. Smart Align : a new tool for robust non-rigid registration of scanning microscope data 2015 Advanced Structural and Chemical Imaging 1 131 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles
Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) 2012 Zeitschrift für Kristallographie 227 4 UA library record; WoS full record; WoS citing articles
Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. Atomic resolution electron tomography 2016 MRS bulletin 41 19 UA library record; WoS full record; WoS citing articles
Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp 2018 Materials 11 15 UA library record; WoS full record; WoS citing articles