Number of records found: 8872
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InAs0.85Sb0.15 infrared photodiodes grown on GaAs and GaAs-coated Si by molecular beam epitaxy”. Dobbelaere W, de Boeck J, Heremans P, Mertens R, Borghs G, Luyten W, van Landuyt J, Applied physics letters 600, 3256 (1992). http://doi.org/10.1063/1.106711
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InAs p-n diodes grown on GaAs and GaAs-coated Si by molecular beam epitaxy”. Dobbelaere W, de Boeck J, Heremans P, Mertens R, Borghs G, Luyten W, van Landuyt J, Applied physics letters 60, 868 (1992). http://doi.org/10.1063/1.106490
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Use of Banana Fibers in SMA Mixtures”. Ferreira da Costa L, de Lucena LCFL, de Lucena AEFL, Grangeiro de Barros A, Journal Of Materials In Civil Engineering 32, 04019341 (2020). http://doi.org/10.1061/(ASCE)MT.1943-5533.0002994
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Dynamic identifiability analysis-based model structure evaluation considering rating curve uncertainty”. Van Hoey S, Nopens I, van der Kwast J, Seuntjens P, Journal of hydrologic engineering 20, 04014072 (2015). http://doi.org/10.1061/(ASCE)HE.1943-5584.0000995
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Mixed layers in copper based superconducting materials”. Hervieu, Van Tendeloo G, Michel, Pelloquin, Raveau, Microscopy, microanalysis, microstructures 7, 107 (1996). http://doi.org/10.1051/mmm:1996109
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Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy”. Verbist K, Van Tendeloo G, Ye M, Schroeder J, Mehbod M, Deltour R, Microscopy, microanalysis, microstructures 7, 17 (1996). http://doi.org/10.1051/mmm:1996104
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Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis”. Oleshko V, Gijbels R, Jacob W, Lakiere F, van Daele A, Silaev E, Kaplun L, Microscopy, microanalysis, microstructures 6, 79 (1995). http://doi.org/10.1051/mmm:1995108
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LAMMA and electron-microprobe analysis of atmospheric aerosols”. Bruynseels F, Storms H, Van Grieken R, Journal de physique 45, 785 (1984). http://doi.org/10.1051/JPHYSCOL:19842180
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Automated quantitative electron-microprobe analysis of particulate material”. Van Dyck P, Storms H, Van Grieken R, Journal de physique 45, 781 (1984). http://doi.org/10.1051/JPHYSCOL:19842179
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Precursor phenomena in a quenched and aged Ni52Ti48 shape memory alloy”. Somsen C, Wassermann EF, Kästner J, Schryvers D, Journal de physique: 4 T2 –, 10th International Conference on Martensitic Transformations, JUN 10-14, 2002, ESPOO, FINLAND 112, 777 (2003). http://doi.org/10.1051/jp4:2003997
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Electron diffraction refinement of the TiNi(Fe) R-phase structure”. Schryvers D, Potapov P, Journal de physique 112, 751 (2003). http://doi.org/10.1051/jp4:2003991
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The analysis of macrotwins in NiAl martensite”. Ball JM, Schryvers D, Journal de physique: 4 T2 –, 10th International Conference on Martensitic Transformations, JUN 10-14, 2002, ESPOO, FINLAND 112, 159 (2003). http://doi.org/10.1051/jp4:2003855
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Microstructure of quenched Ni-rich Ni-Ti shape memory alloys”. Somsen C, Kästner J, Wassermann EF, Boullay P, Schryvers D, Journal de physique: 4 T2 –, 8th European Symposium on Martensitic Transformations (ESOMAT2000), SEP 04-08, 2000, COMO, ITALY 11, 445 (2001). http://doi.org/10.1051/jp4:2001874
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Nanoscale inhomogeneities in melt-spun Ni-Al”. Potapov P, Ochin P, Pons J, Schryvers D, Journal de physique: 4 11, 439 (2001). http://doi.org/10.1051/jp4:2001873
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Structural characterisation of melt-spun Ti-Ni-Cu-ribbons”. Schryvers D, Potapov P, Ledda A, Shelyakov A, Journal de physique: 4 11, 363 (2001). http://doi.org/10.1051/jp4:2001861
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Lattice deformations at martensite-martensite interfaces in Ni-Al”. Schryvers D, Boullay P, Kohn R, Ball J, Journal de physique: 4 11, 23 (2001). http://doi.org/10.1051/jp4:2001804
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Influence of the lattice symmetry on melting of the bilayer Wigner crystal”. Schweigert IV, Schweigert VA, Peeters FM, Journal de physique: 4 T2 –, International Conference on Strongly Coupled Coulomb Systems, SEP 04-10, 1999, ST MALO, FRANCE 10, 117 (2000). http://doi.org/10.1051/jp4:2000515
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HRTEM study of austenite and martensite in splat-cooled and nanoscale thin film Ni-Al”. Schryvers D, Yandouzi M, Holland-Moritz D, Toth L, Journal de physique: 4 C5, 203 (1997). http://doi.org/10.1051/jp4:1997532
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Defect structures in CuZr martensite, studies by CTEM and HRTEM”. Seo JW, Schryvers D, Journal de physique: 4 C5, 149 (1997). http://doi.org/10.1051/jp4:1997523
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Electron microscopy studies of martensite microstructures”. Schryvers D, Journal de physique: 4 C5, 109 (1997). http://doi.org/10.1051/jp4:1997517
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Nucleation and growth of the Ni5Al3 phase in Ni-Al austenite and martensite”. Schryvers D, Toth L, Ma Y, Tanner L, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 299 (1995). http://doi.org/10.1051/jp4:1995246
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Martensitic and related transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 225 (1995). http://doi.org/10.1051/jp4:1995235
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Laser induced phase transition in iron thin films”. Teodorescu VS, Mihailescu IN, Dinescu M, Chitica N, Nistor LC, van Landuyt J, Barborica A, Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4, 127 (1994). http://doi.org/10.1051/jp4:1994427
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SAED and HREM results suggest a NiTi B19' based superstructure for CuZr martensite”. Schryvers D, Journal de physique: colloques, suppléments 5, 1047 (1995). http://doi.org/10.1051/jp4/1995581047
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Ni2Al versus Ni5Al3 ordering in Ni65Al35 austenite and martensite”. Schryvers D, Toth L, van Humbeeck J, Beyer J, Journal de physique: colloques, suppléments 5, 1029 (1995). http://doi.org/10.1051/jp4/1995581029
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3D strain fields surrounding Ni4Ti3: direct measurement and correlation with the R-phase”. Tirry W, Schryvers D, , 02032 (2009). http://doi.org/10.1051/esomat/200902032
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Transmission electron microscopy study of low-hysteresis shape memory alloys”. Delville R, James RD, Salman U, Finel A, Schryvers D, , 02005 (2009). http://doi.org/10.1051/esomat/200902005
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3D FIB/SEM study of Ni4Ti3 precipitates in Ni-Ti alloys with different thermal-mechanical histories”. Cao S, Nishida M, Somsen C, Eggeler G, Schryvers D, , 02004 (2009). http://doi.org/10.1051/esomat/200902004
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Evidence of strain induced structural change in hetero-epitaxial NdNiO3 thin films with metal-insulator transition”. Laffez P, Lebedev OI, Ruello P, Desfeux R, Banerjee G, Capon F, European physical journal: applied physics 25, 25 (2004). http://doi.org/10.1051/epjap:2003087
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Transmission electron microscopy of NdNiO3 thin films on silicon substrates”. Laffez P, Retoux R, Boullay P, Zaghrioui M, Lacorre P, Van Tendeloo G, European physical journal: applied physics 12, 55 (2000). http://doi.org/10.1051/epjap:2000171
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