Number of records found: 76
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Citations
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Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
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Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
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Trace analysis allows to distinguish between Venetian and facon-de-Venise glass vessels of the 16th and 17th century”. de Raedt I, Janssens K, Veeckman J, Vincze L, Vekemans B, Jeffries T, Journal of analytical atomic spectrometry 16, 1012 (2001). http://doi.org/10.1039/B102597J
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The use of lead-glass capillaries for microfocusing of highly energetic (0-60 KeV) synchrotron radiation”. Janssens K, Vincze L, Vekemans B, Adams F, Haller M, Knöchel A, Journal of analytical atomic spectrometry 13, 339 (1998). http://doi.org/10.1039/A707700I
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Use of microscopic XRF for non-destructive analysis in art an archaeometry”. Janssens K, Vittiglio G, Deraedt I, Aerts A, Vekemans B, Vincze L, Wei F, de Ryck I, Schalm O, Adams F, Rindby A, Knöchel A, Simionovici AS, Snigirev A, X-ray spectrometry 29, 73 (2000). http://doi.org/10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
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The use of synchrotron micro-XRF for characterisation of the micro-heterogeneity of low-Z reference materials”. Kempenaers L, Vincze L, Janssens K, Spectrochimica acta: part B : atomic spectroscopy 55, 651 (2000). http://doi.org/10.1016/S0584-8547(00)00207-X
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X-ray optics for synchrotron-radiation-induced X-ray micro fluorescence at the european synchrotron-radiation facility, Grenoble”. Vincze L, Janssens K, Adams F, Institute of physics conference series , 613 (1993)
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Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
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Application of combined micro-proton-induced X-ray emission and micro-synchrotron radiation X-ray fluorescence techniques for the characterization of impact materials around Barringer Meteor Crater”. Uzonyi I, Szöör G, Vekemans B, Vincze L, Rozsa P, Szabo G, Somogyi A, Adams F, Kiss ÁZ, Spectrochimica acta: part B : atomic spectroscopy 59, 1717 (2004). http://doi.org/10.1016/J.SAB.2004.05.030
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Characterization of impact materials around Barringer meteor crater by micro-PIXE nd micro-SRXRF techniques”. Uzonyi I, Szöör G, Rozsa P, Vekemans B, Vincze L, Adams F, Drakopoulos M, Somogyi A, Kiss ÁZ, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 219/220, 555 (2004). http://doi.org/10.1016/J.NIMB.2004.01.119
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Detection of a Ca-rich lithology in the Earth's deep (>, 300 km) convecting mantle”. Brenker FE, Vincze L, Vekemans B, Nasdala L, Stachel T, Vollmer C, Kersten M, Somogyi A, Adams F, Joswig W, Harris JW, Earth and planetary science letters 236, 579 (2005). http://doi.org/10.1016/J.EPSL.2005.05.021
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Effects of beamline components (undulators, monochromator, focusing devices) on the beam intensity at ID18F (ESRF)”. Somogyi A, Drakopoulos M, Vekemans B, Vincze L, Simionovici AS, Adams F, Nuclear instruments and methods: B 199, 559 (2003). http://doi.org/10.1016/S0168-583X(02)01535-5
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Processing of three-dimensional microscopic X-ray fluorescence data”. Vekemans B, Vincze L, Brenker FE, Adams F, Journal of analytical atomic spectrometry 19, 1302 (2004). http://doi.org/10.1039/B404300F
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Quantitative X-ray fluorescence analysis at the ESRF ID18F microprobe”. Vekemans B, Vincze L, Somogyi A, Drakopoulos M, Kempenaers L, Simionovici AS, Adams F, Nuclear instruments and methods: B 199, 396 (2003). http://doi.org/10.1016/S0168-583X(02)01396-4
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Study of a unique 16th century Antwerp majolica floor in the Rameyenhof castle's chapel by means of X-ray fluorescence and portable Raman analytical instrumentation”. Van de Voorde L, Vandevijvere M, Vekemans B, Van Pevenage J, Caen J, Vandenabeele P, van Espen P, Vincze L, Spectrochimica acta: part B : atomic spectroscopy 102, 28 (2014). http://doi.org/10.1016/J.SAB.2014.10.007
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Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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