Number of records found: 3074
 | 
Citations
 | 
   web
Properties and thermal stability of solution processed ultrathin, high-k bismuth titanate (Bi2Ti2O7) films”. Hardy A, Van Elshocht S, De Dobbelaere C, Hadermann J, Pourtois G, De Gendt S, Afanas'ev VV, Van Bael MK, Materials research bulletin 47, 511 (2012). http://doi.org/10.1016/j.materresbull.2012.01.001
toggle visibility
The properties of SIRT, TVM, and DART for 3D imaging of tubular domains in nanocomposite thin-films and sections”. Chen D, Goris B, Bleichrodt F, Heidari Mezerji H, Bals S, Batenburg KJ, de With G, Friedrich H, Ultramicroscopy 147, 137 (2014). http://doi.org/10.1016/j.ultramic.2014.08.005
toggle visibility
Prospects for versatile phase manipulation in the TEM : beyond aberration correction”. Guzzinati G, Clark L, Béché, A, Juchtmans R, Van Boxem R, Mazilu M, Verbeeck J, Ultramicroscopy 151, 85 (2015). http://doi.org/10.1016/j.ultramic.2014.10.007
toggle visibility
A protecting group approach toward synthesis of Au-silica Janus nanostars”. Rodríguez-Fernández D, Altantzis T, Heidari H, Bals S, Liz-Marzan LM, Chemical communications 50, 79 (2014). http://doi.org/10.1039/c3cc47531j
toggle visibility
Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices”. Holden T, Habermeier H-U, Cristiani G, Golnik A, Boris A, Pimenov A, Humlicek J, Lebedev OI, Van Tendeloo G, Keimer B, Bernhard C, Physical review : B : condensed matter and materials physics 69, 064505 (2004). http://doi.org/10.1103/PhysRevB.69.064505
toggle visibility
Damage evaluation in graphene underlying atomic layer deposition dielectrics”. Tang X, Reckinger N, Poncelet O, Louette P, Urena F, Idrissi H, Turner S, Cabosart D, Colomer J-F, Raskin J-P, Hackens B, Francis LA, Scientific reports 5, 13523 (2015). http://doi.org/10.1038/srep13523
toggle visibility
Prussian blue analogues of reduced dimensionality”. Gengler RYN, Toma LM, Pardo E, Lloret F, Ke X, Van Tendeloo G, Gournis D, Rudolf P, Small 8, 2532 (2012). http://doi.org/10.1002/smll.201200517
toggle visibility
Pulsed laser deposition of SrTiO3 on a H-terminated Si substrate”. Spreitzer M, Egoavil R, Verbeeck J, Blank DHA, Rijnders G, Journal of materials chemistry C : materials for optical and electronic devices 1, 5216 (2013). http://doi.org/10.1039/c3tc30913d
toggle visibility
Purification of catalytically produced multi-wall nanotubes”. Colomer J-F, Piedigrosso P, Willems I, Journet C, Bernier P, Van Tendeloo G, Fonseca A, Nagy JB, Journal of the Chemical Society : Faraday transactions: physical chemistry and chemical physics 94, 3753 (1998). http://doi.org/10.1039/a806804f
toggle visibility
Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy”. Bertoni G, Beyers E, Verbeeck J, Mertens M, Cool P, Vansant EF, Van Tendeloo G, Ultramicroscopy 106, 630 (2006). http://doi.org/10.1016/j.ultramic.2006.03.006
toggle visibility
Quantifying inflow uncertainties for CFD simulations of the flow in downtown Oklahoma City”. García-Sánchez C, Philips DA, Gorlé, C, Building and environment 78, 118 (2014). http://doi.org/10.1016/j.buildenv.2014.04.013
toggle visibility
Quantitative 3-D morphologic and distributional study of Ni4Ti3 precipitates in a Ni51Ti49 single crystal alloy”. Cao S, Pourbabak S, Schryvers D, Scripta materialia 66, 650 (2012). http://doi.org/10.1016/j.scriptamat.2012.01.045
toggle visibility
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
toggle visibility
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy”. Martinez GT, Rosenauer A, de Backer A, Verbeeck J, Van Aert S, Ultramicroscopy 137, 12 (2014). http://doi.org/10.1016/j.ultramic.2013.11.001
toggle visibility
Quantitative determination of strain fields around Ni4Ti3 precipitates in NiTi”. Tirry W, Schryvers D, Acta materialia 53, 1041 (2005). http://doi.org/10.1016/j.actamat.2004.10.049
toggle visibility
Quantitative determination of the crystal structure of Ni4Ti3 precipitates”. Tirry W, Schryvers D, Jorissen K, Lamoen D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 438, 517 (2006). http://doi.org/10.1016/j.msea.2006.02.063
toggle visibility
Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing”. Bals S, Verbeeck J, Van Tendeloo G, Liu Y-L, Grivel J-C, Journal of the American Ceramic Society 88, 431 (2005). http://doi.org/10.1111/j.1551-2916.2005.00094.x
toggle visibility
Quantitative electron tomography : the effect of the three-dimensional point spread function”. Heidari H, van den Broek W, Bals S, Ultramicroscopy 135, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.06.005
toggle visibility
Quantitative Landau potentials for the martensitic transformation in Ni-Al”. Salje EKH, Zhang H, Schryvers D, Bartova B, Applied physics letters 90, 221903 (2007). http://doi.org/10.1063/1.2743927
toggle visibility
Quantitative measurement of orbital angular momentum in electron microscopy”. Clark L, Béché, A, Guzzinati G, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 053818 (2014). http://doi.org/10.1103/PhysRevA.89.053818
toggle visibility
Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
toggle visibility
Quantitative structure determination of large three-dimensional nanoparticle assemblies”. Altantzis T, Goris B, Sánchez-Iglesias A, Grzelczak M, Liz-Marzán LM, Bals S, Particle and particle systems characterization 30, 84 (2013). http://doi.org/10.1002/ppsc.201200045
toggle visibility
Quantitative study of particle size distribution in an in-situ grown Al-TiB2 composite by synchrotron X-ray diffraction and electron microscopy”. Tang Y, Chen Z, Borbely A, Ji G, Zhong SY, Schryvers D, Ji V, Wang HW, Materials characterization 102, 131 (2015). http://doi.org/10.1016/j.matchar.2015.03.003
toggle visibility
Quantitative three-dimensional analysis of Ni4Ti3 precipitate morphology and distribution in polycrystalline Ni-Ti”. Cao S, Nishida M, Schryvers D, Acta materialia 59, 1780 (2011). http://doi.org/10.1016/j.actamat.2010.11.044
toggle visibility
Quantitative three-dimensional modeling of zeotile through discrete electron tomography”. Bals S, Batenburg KJ, Liang D, Lebedev O, Van Tendeloo G, Aerts A, Martens JA, Kirschhock CE, Journal of the American Chemical Society 131, 4769 (2009). http://doi.org/10.1021/ja8089125
toggle visibility
Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes”. Bals S, Batenburg J, Verbeeck J, Sijbers J, Van Tendeloo G, Nano letters 7, 3669 (2007). http://doi.org/10.1021/nl071899m
toggle visibility
Quantum cutting in Li (770 nm) and Yb (1000 nm) co-dopant emission bands by energy transfer from the ZnO nano-crystalline host”. Shestakov MV, Tikhomirov VK, Kirilenko D, Kuznetsov AS, Chibotaru LF, Baranov AN, Van Tendeloo G, Moshchalkov VV, Optics express 19, 15955 (2011). http://doi.org/10.1364/OE.19.015955
toggle visibility
Quantum-size effects on T-c in superconducting nanofilms”. Shanenko AA, Croitoru MD, Peeters FM, Europhysics letters 76, 498 (2006). http://doi.org/10.1209/epl/i2006-10274-6
toggle visibility
Quantum transport in a cylindrical sub-0.1 μm silicon-based MOSFET”. Balaban SN, Pokatilov EP, Fomin VM, Gladilin VN, Devreese JT, Magnus W, Schoenmaker W, van Rossum M, Sorée B, Solid-State Electronics 46, 435 (2002). http://doi.org/10.1016/S0038-1101(01)00117-4
toggle visibility
Quantum transport in a nanosize double-gate metal-oxide-semiconductor field-effect transistor”. Croitoru MD, Gladilin VN, Fomin VM, Devreese JT, Magnus W, Schoenmaker W, Sorée B, Journal of applied physics 96, 2305 (2004). http://doi.org/10.1063/1.1767619
toggle visibility