toggle visibility
Search within Results:
Display Options:
Number of records found: 3074

Select All    Deselect All
 | 
Citations
 | 
   print
Magnetic and electronic properties of the interface between half metallic Fe3O4 and semiconducting ZnO”. Brück S, Paul M, Tian H, Müller A, Kufer D, Praetorius C, Fauth K, Audehm P, Goering E, Verbeeck J, Van Tendeloo G, Sing M, Claessen R;, Applied physics letters 100, 081603 (2012). http://doi.org/10.1063/1.3687731
toggle visibility
Magnetic and magnetodielectric properties of erbium iron garnet ceramic”. Maignan A, Singh K, Simon C, Lebedev OI, Martin C, Tan H, Verbeeck J, Van Tendeloo G, Journal of applied physics 113, 033905 (2013). http://doi.org/10.1063/1.4776716
toggle visibility
Magnetic and structural studies of the multifunctional material SrFe0.75Mo0.25O3-\text{\textgreek{d}}”. Retuerto M, Li MR, Go YB, Ignatov A, Croft M, Ramanujachary KV, Hadermann J, Hodges JP, Herber RH, Nowik I, Greenblatt M;, Inorganic chemistry 51, 12273 (2012). http://doi.org/10.1021/ic301550m
toggle visibility
Magnetic-field induced quantum-size cascades in superconducting nanowires”. Shanenko AA, Croitoru MD, Peeters FM, Physical review : B : condensed matter and materials physics 78, 024505 (2008). http://doi.org/10.1103/PhysRevB.78.024505
toggle visibility
Magnetic monopole field exposed by electrons”. Béché, A, Van Boxem R, Van Tendeloo G, Verbeeck J, Nature physics 10, 26 (2014). http://doi.org/10.1038/NPHYS2816
toggle visibility
Magnetically decorated multiwalled carbon nanotubes as dual MRI and SPECT contrast agents”. Wang JTW, Cabana L, Bourgognon M, Kafa H, Protti A, Venner K, Shah AM, Sosabowski JK, Mather SJ, Roig A, Ke X, Van Tendeloo G, de Rosales RTM, Tobias G, Al-Jamal KT, Advanced functional materials 24, 1880 (2014). http://doi.org/10.1002/adfm.201302892
toggle visibility
Magnetodielectric CuCr0.5V0.5O2 : an example of a magnetic and dielectric multiglass”. Singh K, Maignan A, Simon C, Kumar S, Martin C, Lebedev O, Turner S, Van Tendeloo G, Journal of physics : condensed matter 24, 226002 (2012). http://doi.org/10.1088/0953-8984/24/22/226002
toggle visibility
Magnetotransport across the metal-graphene hybrid interface and its modulation by gate voltage”. Chen J-J, Ke X, Van Tendeloo G, Meng J, Zhou Y-B, Liao Z-M, Yu D-P, Nanoscale 7, 5516 (2015). http://doi.org/10.1039/c5nr00223k
toggle visibility
Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
toggle visibility
Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures”. Tan H, Egoavil R, Béché, A, Martinez GT, Van Aert S, Verbeeck J, Van Tendeloo G, Rotella H, Boullay P, Pautrat A, Prellier W, Physical review : B : condensed matter and materials physics 88, 155123 (2013). http://doi.org/10.1103/PhysRevB.88.155123
toggle visibility
Mapping spin-polarized transitions with atomic resolution”. Schattschneider P, Schaffer B, Ennen I, Verbeeck J, Physical review : B : condensed matter and materials physics 85, 134422 (2012). http://doi.org/10.1103/PhysRevB.85.134422
toggle visibility
Martensitic and bainitic transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 C2, 225 (1994)
toggle visibility
Martensitic and related transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 225 (1995). http://doi.org/10.1051/jp4:1995235
toggle visibility
The martensitic phase transition in Ni-Al: experimental observation of excess entropy and heterogeneous spontaneous strain”. Zhang H, Salje EKH, Schryvers D, Bartova B, Journal of physics : condensed matter 20, 055220 (2008). http://doi.org/10.1088/0953-8984/20/5/055220
toggle visibility
Martensitic transformations and microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275, 697 (1999). http://doi.org/10.1016/S0921-5093(99)00399-8
toggle visibility
Martensitic transformations studied on nano- and microscopic length scales”. Schryvers D, Boullay P, Potapov P, Satto C, Festkörperprobleme 40, 375 (2000)
toggle visibility
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework”. den Dekker AJ, Van Aert S, van den Bos A, van Dyck D, Ultramicroscopy 104, 83 (2005). http://doi.org/10.1016/j.ultramic.2005.03.001
toggle visibility
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D, Chen JH, Ultramicroscopy 104, 107 (2005). http://doi.org/10.1016/j.ultramic.2005.03.002
toggle visibility
Measurement of specimen thickness by phase change determination in TEM”. Croitoru MD, van Dyck D, Liu YZ, Zhang Z, Ultramicroscopy 108, 1616 (2008). http://doi.org/10.1016/j.ultramic.2008.06.002
toggle visibility
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Microscopy of Semiconducting Materials 107SPRINGER PROCEEDINGS IN PHYSICS, 303 (2005)
toggle visibility
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Waag A, Applied Physics Letters 86 (2005). http://doi.org/10.1063/1.1901820
toggle visibility
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering”. Hendrich C, Favre L, Ievlev DN, Dobrynin AN, Bras W, Hörmann U, Piscopiello E, Van Tendeloo G, Lievens P, Temst K, Applied physics A : materials science &, processing 86, 533 (2007). http://doi.org/10.1007/s00339-006-3808-5
toggle visibility
Measuring lattice strain in three dimensions through electron microscopy”. Goris B, de Beenhouwer J, de Backer A, Zanaga D, Batenburg KJ, Sánchez-Iglesias A, Liz-Marzán LM, Van Aert S, Bals S, Sijbers J, Van Tendeloo G, Nano letters 15, 6996 (2015). http://doi.org/10.1021/acs.nanolett.5b03008
toggle visibility
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy”. Felten A, Gillon X, Gulas M, Pireaux J-J, Ke X, Van Tendeloo G, Bittencourt C, Najafi E, Hitchcock AP, ACS nano 4, 4431 (2010). http://doi.org/10.1021/nn1002248
toggle visibility
Measuring porosity at the nanoscale by quantitative electron tomography”. Biermans E, Molina L, Batenburg KJ, Bals S, Van Tendeloo G, Nano letters 10, 5014 (2010). http://doi.org/10.1021/nl103172r
toggle visibility
Measuring strain fields and concentration gradients around Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang ZQ;, Materials science and engineering A: structural materials properties microstructure and processing 438, 485 (2006). http://doi.org/10.1016/j.msea.2006.02.166
toggle visibility
Measuring the absolute position of EELS ionisation edges in a TEM”. Potapov PL, Schryvers D, Ultramicroscopy 99, 73 (2004). http://doi.org/10.1016/S0304-3991(03)00185-2
toggle visibility
Measuring the corrugation amplitude of suspended and supported graphene”. Kirilenko DA, Dideykin AT, Van Tendeloo G, Physical review : B : condensed matter and materials physics 84, 235417 (2011). http://doi.org/10.1103/PhysRevB.84.235417
toggle visibility
Measuring the orbital angular momentum of electron beams”. Guzzinati G, Clark L, Béché, A, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 025803 (2014). http://doi.org/10.1103/PhysRevA.89.025803
toggle visibility
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à, haute Tc”. Hervieu M, Michel C, Martin C, Huvé, M, Van Tendeloo G, Maignan A, Pelloquin D, Goutenoire F, Raveau B, Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4, 2057 (1994)
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: