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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Janssens, K.; Alfeld, M.; Van der Snickt, G.; De Nolf, W.; Vanmeert, F.; Monico, L.; Legrand, S.; Dik, J.; Cotte, M.; Falkenberg, G.; van der Loeff, L.; Leeuwestein, M.; Hendriks, E. |
Examination of Vincent van Gogh's paintings and pigments by means of state-of-the-art analytical methods |
2014 |
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UA library record |
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Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. |
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison |
2007 |
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UA library record |
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Alfeld, M.; Janssens, K.; Sasov, A.; Liu, X.; Kostenko, A.; Rickers-Appel, K.; Falkenberg, G. |
The use of full-field XRF for simultaneous elemental mapping |
2010 |
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8 |
UA library record; WoS full record; WoS citing articles |
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Anitha, A.; Brasoveanu, A.; Duarte, M.F.; Hughes, S.M.; Daubechies, I.; Dik, J.; Janssens, K.; Alfeld, M. |
Virtual underpainting reconstruction from X-ray fluorescence imaging data |
2011 |
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UA library record; WoS full record; WoS citing articles |
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