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Conformation-Dependent Monolayer and Bilayer Structures of an Alkylated TTF Derivative Revealed using STM and Molecular Modeling”. Delfino CL, Hao Y, Martin C, Minoia A, Gopi E, Mali KS, Van der Auweraer M, Geerts YH, Van Aert S, Lazzaroni R, De Feyter S, The Journal of Physical Chemistry C 127, 23023 (2023). http://doi.org/10.1021/acs.jpcc.3c04913
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In Situ Plasma Studies Using a Direct Current Microplasma in a Scanning Electron Microscope”. Grünewald L, Chezganov D, De Meyer R, Orekhov A, Van Aert S, Bogaerts A, Bals S, Verbeeck J, Advanced Materials Technologies (2024). http://doi.org/10.1002/admt.202301632
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Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination”. Şentürk DG, De Backer A, Van Aert S, Ultramicroscopy 259, 113941 (2024). http://doi.org/10.1016/j.ultramic.2024.113941
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Low-dose 4D-STEM tomography for beam-sensitive nanocomposites”. Hugenschmidt M, Jannis D, Kadu AA, Grünewald L, De Marchi S, Perez-Juste J, Verbeeck J, Van Aert S, Bals S, ACS materials letters 6, 165 (2023). http://doi.org/10.1021/ACSMATERIALSLETT.3C01042
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Sampling real-time atomic dynamics in metal nanoparticles by combining experiments, simulations, and machine learning”. Cioni M, Delle Piane M, Polino D, Rapetti D, Crippa M, Arslan Irmak E, Van Aert S, Bals S, Pavan GM, Advanced Science , 1 (2024). http://doi.org/10.1002/ADVS.202307261
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Single-layered imine-linked porphyrin-based two-dimensional covalent organic frameworks targeting CO₂, reduction”. Arisnabarreta N, Hao Y, Jin E, Salame A, Muellen K, Robert M, Lazzaroni R, Van Aert S, Mali KS, De Feyter S, Advanced energy materials (2024). http://doi.org/10.1002/AENM.202304371
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Stabilizing perovskite Pb(Mg0.33Nb0.67)O3-PbTiO3 thin films by fast deposition and tensile mismatched growth template”. Ni S, Houwman E, Gauquelin N, Chezganov D, Van Aert S, Verbeeck J, Rijnders G, Koster G, ACS applied materials and interfaces 16, 12744 (2024). http://doi.org/10.1021/ACSAMI.3C16241
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Meer zien met onzichtbaar licht”. Van Aert S, Karakter : tijdschrift van wetenschap 18, 19 (2007)
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Three-dimensional reconstruction of a nanoparticle at atomic resolution”. Batenburg J, Van Aert S, ERCIM news 86, 52 (2011)
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Atomen tellen”. Van Aert S, Batenburg J, Van Tendeloo S, Nederlands tijdschrift voor natuurkunde (1991) 77, 292 (2011)
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Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
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Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
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Zhang Z, Lobato I, Brown H, Jannis D, Verbeeck J, Van Aert S, Nellist P (2023) Generalised oscillator strength for core-shell electron excitation by fast electrons based on Dirac solutions
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Grü,newald L, Chezganov D, De Meyer R, Orekhov A, Van Aert S, Bogaerts A, Bals S, Verbeeck J (2023) Supplementary Information for “In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope”
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Cioni M, Delle Piane M, Polino D, Rapetti D, Crippa M, Arslan Irmak E, Pavan GM, Van Aert S, Bals S (2024) Data for Sampling Real‐Time Atomic Dynamics in Metal Nanoparticles by Combining Experiments, Simulations, and Machine Learning
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Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays”. Dunin-Borkowski RE, Lichte H, Tillmann K, Van Aert S, Van Tendeloo G, Ultramicroscopy 134, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.07.013
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High-resolution visualization techniques : structural aspects”. Schryvers D, Van Aert S Springer, Berlin, page 135 (2012).
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Statistical experimental design for quantitative atomic resolution transmission electron microscopy”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D Academic Press, San Diego, Calif., page 1 (2004).
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Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
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The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data”. Van Aert S, Bals S, Chang LY, den Dekker AJ, Kirkland AI, Van Dyck D, Van Tendeloo G Springer, Berlin, page 97 (2008).
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High resolution electron microscopy from imaging towards measuring”. Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3. Ieee, page 2081 (2001).
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Atom column detection”. Fatermans J, de Backer A, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 177 (2021).
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Atom counting”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 91 (2021).
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Efficient fitting algorithm”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 73 (2021).
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General conclusions and future perspectives”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 243 (2021).
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Image-quality evaluation and model selection with maximum a posteriori probability”. Fatermans J, de Backer A, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 215 (2021).
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Introduction”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 1 (2021).
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Optimal experiment design for nanoparticle atom counting from ADF STEM images”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 145 (2021).
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Statistical parameter estimation theory : principles and simulation studies”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 29 (2021).
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The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
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