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Year
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Piñera, I.
;
Abreu, Y.
;
van Espen, P.
;
Diaz, A.
;
Leyva, A.
;
Cruz, C.M.
Radiation damage evaluation on LYSO and LuYAP materials through Dpa calculation assisted by Monte Carlo method
2011
IEEE conference record T2 – IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN
UA library record
;
WoS full record
;
WoS citing articles
