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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Van Aert, S.
;
den Dekker, A.J.
;
van den Bos, A.
;
van Dyck, D.
High-resolution electron microscopy : from imaging toward measuring
2002
IEEE transactions on instrumentation and measurement
51
13
UA library record
;
WoS full record
;
WoS citing articles
Van Aert, S.
;
den Dekker, A.J.
;
van den Bos, A.
;
van Dyck, D.
Statistical experimental design for quantitative atomic resolution transmission electron microscopy
2004
13
UA library record
;
WoS full record
;
WoS citing articles
Van Aert, S.
;
den Dekker, A.J.
;
van den Bos, A.
;
Van Dyck, D.
High resolution electron microscopy from imaging towards measuring
2001
... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3
UA library record