Abstract: Closing material loops and reducing resource extraction is considered to be the foundation of the circular economy that delivers environmental gains. Today, certain materials with large environmental impacts, such as plastics, are placed high on the circularity agenda. In this thesis, the market acceptance of circular plastics is analyzed. Firstly, the current – mostly linear – market for plastics in the European Union is analyzed. We find that market failure and uncertainties lead to postponed and scaled down private investments in recycling facilities for plastics. As a consequence, we conclude the failing and uncertain market needs government intervention. Secondly, potential government interventions that alleviate the market failure and reduce the present uncertainties are analyzed. Government intervention can be either incentive-based or regulatory-based. The Flemish government already acts as an incentivizer. For more than two decades already, a tax is levied on the incineration of plastic waste. We find that this tax reduces industrial plastic waste generation, but fails to elicit investments in recycling facilities. Regulatory-based policies are expected to gain in importance in the pursuit of a circular economy. Indeed, in the European Commission’s latest circularity action plan, a policy to mandate the use of recycled plastics is signaled. Mandating the use of recycled plastics can enable the circularity of plastics effectively. However, it would also generate a shock wave on the market, especially because, i.a. the implementation time of such a policy is uncertain. We investigate how firms can invest optimally in the use of recycled plastics under the presence of policy uncertainty. We conclude that the European market will be able to successfully adopt circular plastics. However, stimulating policies, both incentive-based and regulatory-based, turn out to be essential in this adoption process. Therefore, there will be a need for a combination of policies in order to prevent the incessant mass single-use consumption of plastics, which harms the environment.

Abstract: Currently, a large variety of materials are studied by transmission electron microscopy (TEM) as it offers the possibility to perform structural and elemental analysis at a local scale. Relatively recent advances in aberration correctors and electron sources allow the instrument to achieve atomic resolution. Along with these advances, a state-of-the-art technology has been reached in TEM. However, the instrument is far from being perfect and imperfections or external sources can make the interpretation of information troublesome. Environmental factors such as acoustic and mechanical vibrations, temperature fluctuations, etc., can induce sample drift and create image distortions. These distortions are enhanced in scanning operation because of the serial acquisition of the information, which are more apparent at atomic resolution as small field of views are imaged. In addition, scanning distortions are induced due to the finite time response of the scan coils. These types of distortions would reduce precision in atomic-scale strain analysis, for instance, in semiconductors. Most of the efforts to correct these distortions are focused on data processing techniques post-acquisition. Another limitation in TEM is beam damage effects. Beam damage arises because of the energy transferred to the sample in electron-sample interactions. In scanning TEM, at atomic resolution, the increased electron charge density (electron dose) carried on a sub-Å size electron probe may aggravate beam damage effects. Soft materials such as zeolites, organic, biological materials, etc., can be destroyed under irradiation limiting the amount of information that can be acquired. Current efforts to circumvent beam damage are mostly based on low electron dose acquisitions and data processing methods to maximize the signal at low dose conditions. In this thesis, a different approach is given to address drift and scanning distortions, as well as beam damage effects. Novel scan strategies are proposed for that purpose, which are shown to substantially overcome these issues compared to the standard scan method in TEM.