Number of records found: 3074
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Quasicrystalline clusters transformed from C14-MgZn₂, nanoprecipitates in Al alloys”. Yang T, Kong Y, Li K, Lu Q, Wang Y, Du Y, Schryvers D, Materials characterization 199, 112772 (2023). http://doi.org/10.1016/J.MATCHAR.2023.112772
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Quantum-size effects on T-c in superconducting nanofilms”. Shanenko AA, Croitoru MD, Peeters FM, Europhysics letters 76, 498 (2006). http://doi.org/10.1209/epl/i2006-10274-6
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Quantum wavefront shaping with a 48-element programmable phase plate for electrons”. Yu CP, Vega Ibañez F, Béché, A, Verbeeck J, SciPost Physics 15, 223 (2023). http://doi.org/10.21468/SciPostPhys.15.6.223
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Quantum transport in an ultra-thin SOI MOSFET: influence of the channel thickness on the I-V characteristics”. Croitoru MD, Gladilin VN, Fomin VM, Devreese JT, Magnus W, Schoenmaker W, Sorée B, Solid state communications 147, 31 (2008). http://doi.org/10.1016/j.ssc.2008.04.025
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Quantum transport in a nanosize silicon-on-insulator metal-oxide-semiconductor field effect transistor”. Croitoru MD, Gladilin VN, Fomin VM, Devreese JT, Magnus W, Schoenmaker W, Sorée B, Journal of applied physics 93, 1230 (2003). http://doi.org/10.1063/1.1533108
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Quantum transport in a nanosize double-gate metal-oxide-semiconductor field-effect transistor”. Croitoru MD, Gladilin VN, Fomin VM, Devreese JT, Magnus W, Schoenmaker W, Sorée B, Journal of applied physics 96, 2305 (2004). http://doi.org/10.1063/1.1767619
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Quantum transport in a cylindrical sub-0.1 μm silicon-based MOSFET”. Balaban SN, Pokatilov EP, Fomin VM, Gladilin VN, Devreese JT, Magnus W, Schoenmaker W, van Rossum M, Sorée B, Solid-State Electronics 46, 435 (2002). http://doi.org/10.1016/S0038-1101(01)00117-4
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Quantum cutting in Li (770 nm) and Yb (1000 nm) co-dopant emission bands by energy transfer from the ZnO nano-crystalline host”. Shestakov MV, Tikhomirov VK, Kirilenko D, Kuznetsov AS, Chibotaru LF, Baranov AN, Van Tendeloo G, Moshchalkov VV, Optics express 19, 15955 (2011). http://doi.org/10.1364/OE.19.015955
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Quantitatively linking morphology and optical response of individual silver nanohedra”. Wang Y, Sztranyovszky Z, Zilli A, Albrecht W, Bals S, Borri P, Langbein W, Nanoscale 14, 11028 (2022). http://doi.org/10.1039/D2NR02131E
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Quantitative Tomography of Organic Photovoltaic Blends at the Nanoscale”. Pfannmöller M, Heidari H, Nanson L, Lozman OR, Chrapa M, Offermans T, Nisato G, Bals S, Nano letters 15, 6634 (2015). http://doi.org/10.1021/acs.nanolett.5b02437
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Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes”. Bals S, Batenburg J, Verbeeck J, Sijbers J, Van Tendeloo G, Nano letters 7, 3669 (2007). http://doi.org/10.1021/nl071899m
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Quantitative three-dimensional modeling of zeotile through discrete electron tomography”. Bals S, Batenburg KJ, Liang D, Lebedev O, Van Tendeloo G, Aerts A, Martens JA, Kirschhock CE, Journal of the American Chemical Society 131, 4769 (2009). http://doi.org/10.1021/ja8089125
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Quantitative three-dimensional analysis of Ni4Ti3 precipitate morphology and distribution in polycrystalline Ni-Ti”. Cao S, Nishida M, Schryvers D, Acta materialia 59, 1780 (2011). http://doi.org/10.1016/j.actamat.2010.11.044
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Quantitative study of particle size distribution in an in-situ grown Al-TiB2 composite by synchrotron X-ray diffraction and electron microscopy”. Tang Y, Chen Z, Borbely A, Ji G, Zhong SY, Schryvers D, Ji V, Wang HW, Materials characterization 102, 131 (2015). http://doi.org/10.1016/j.matchar.2015.03.003
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Quantitative structure determination of large three-dimensional nanoparticle assemblies”. Altantzis T, Goris B, Sánchez-Iglesias A, Grzelczak M, Liz-Marzán LM, Bals S, Particle and particle systems characterization 30, 84 (2013). http://doi.org/10.1002/ppsc.201200045
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Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography”. Cooper D, Rouvière J-L, Béché, A, Kadkhodazadeh S, Semenova ES, Dunin-Borkowsk R, Applied physics letters 99, 261911 (2011). http://doi.org/10.1063/1.3672194
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Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
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Quantitative morphometric analysis of single gold nanoparticles by optical extinction microscopy: Material permittivity and surface damping effects”. Payne LM, Masia F, Zilli A, Albrecht W, Borri P, Langbein W, Journal Of Chemical Physics 154, 044702 (2021). http://doi.org/10.1063/5.0031012
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Quantitative modeling of secondary electron emission from slow-ion bombardment on semiconductors”. Bercx M, Partoens B, Lamoen D, Physical review B 99, 085413 (2019). http://doi.org/10.1103/PhysRevB.99.085413
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Martí,nez Alanis GT (2015) Quantitative model-based high angle annular dark field scanning transmission electron microscopy. Antwerpen
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Quantitative measurement of orbital angular momentum in electron microscopy”. Clark L, Béché, A, Guzzinati G, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 053818 (2014). http://doi.org/10.1103/PhysRevA.89.053818
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Quantitative measurement for the microstructural parameters of nano-precipitates in Al-Mg-Si-Cu alloys”. Li K, Idrissi H, Sha G, Song M, Lu J, Shi H, Wang W, Ringer SP, Du Y, Schryvers D, Materials characterization 118, 352 (2016). http://doi.org/10.1016/j.matchar.2016.06.007
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Quantitative Landau potentials for the martensitic transformation in Ni-Al”. Salje EKH, Zhang H, Schryvers D, Bartova B, Applied physics letters 90, 221903 (2007). http://doi.org/10.1063/1.2743927
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Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach”. Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D, Micron 94, 66 (2017). http://doi.org/10.1016/j.micron.2016.12.005
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Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation”. Grieb T, Tewes M, Schowalter M, Müller-Caspary K, Krause FF, Mehrtens T, Hartmann J-M, Rosenauer A, Ultramicroscopy 184, 29 (2018). http://doi.org/10.1016/J.ULTRAMIC.2017.09.012
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Quantitative FIB/SEM three-dimensional characterization of a unique Ni₄Ti₃, network in a porous Ni50.8Ti49.2 alloy undergoing a two-step martensitic transformation”. Cao S, Zeng CY, Li YY, Yao X, Ma X, Samaee V, Schryvers D, Zhang XP, Materials Characterization 169, 110595 (2020). http://doi.org/10.1016/J.MATCHAR.2020.110595
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Heidari Mezerji H (2012) Quantitative electron tomography of nanoparticles. Antwerpen
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Quantitative electron tomography : the effect of the three-dimensional point spread function”. Heidari H, van den Broek W, Bals S, Ultramicroscopy 135, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.06.005
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Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing”. Bals S, Verbeeck J, Van Tendeloo G, Liu Y-L, Grivel J-C, Journal of the American Ceramic Society 88, 431 (2005). http://doi.org/10.1111/j.1551-2916.2005.00094.x
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Karakulina O (2018) Quantitative electron diffraction tomography for structure characterization of cathode materials for Li-ion batteries. Antwerpen
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