Number of records found: 71
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Citations
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Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries”. van der Linden V, Schalm O, Houbraken J, Thomas M, Meesdom E, Devos A, van Dooren R, Nieuwdorp H, Janssen E, Janssens K, X-ray spectrometry 39, 112 (2010). http://doi.org/10.1002/XRS.1207
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Characterization of a polycapillary lens for use in micro-XANES experiments”. Proost K, Vincze L, Janssens K, Gao N, Bulska E, Schreiner M, Falkenberg G, X-ray spectrometry 32, 215 (2003). http://doi.org/10.1002/XRS.635
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Awards for best referees of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 68 (2014). http://doi.org/10.1002/XRS.2530
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Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 9, 70 (1980). http://doi.org/10.1002/XRS.1300090209
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Automated segmentation of μ-XRF image sets”. Vekemans B, Janssens K, Vincze L, Aerts A, Adams F, Hertogen J, X-ray spectrometry 26, 333 (1997)
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Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution”. Van Dyck P, Van Grieken R, X-ray spectrometry 12, 111 (1983). http://doi.org/10.1002/XRS.1300120306
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Assessment of aerosol particles within the Rubens' House Museum in Antwerp, Belgium”. Godoi RHM, Potgieter-Vermaak S, Godoi AFL, Stranger M, Van Grieken R, X-ray spectrometry 37, 298 (2008). http://doi.org/10.1002/XRS.1049
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Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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A simple absorption correction for electron probe X-ray microanalysis of bulk samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 115 (1986). http://doi.org/10.1002/XRS.1300150209
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2014 Award for best referee of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 311 (2014). http://doi.org/10.1002/XRS.2564
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