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Y2O3 inclusions in YBa2Cu3O7-\delta thin films”. Verbist K, Vasiliev AL, Van Tendeloo G, Applied physics letters 66, 1424 (1995). http://doi.org/10.1063/1.113266
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Yukawa particles confined in a channel and subject to a periodic potential : ground state and normal modes”. Carvalho JCN, Ferreira WP, Farias GA, Peeters FM, Physical review : B : condensed matter and materials physics 83, 094109 (2011). http://doi.org/10.1103/PhysRevB.83.094109
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Young people's acceptance of bioenergy and the influence of attitude strength on information provision”. Van Dael M, Lizin S, Swinnen G, Van Passel S, Renewable Energy 107, 417 (2017). http://doi.org/10.1016/J.RENENE.2017.02.010
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Young Anthony van Dyck revisited : a multidisciplinary approach to a portrait once attributed to Peter Paul Rubens”. Van der Stighelen K, Janssens K, van der Snickt G, Alfeld M, Van Beneden B, Demarsin B, Proesmans M, Marchal G, Dik J, Art matters : international journal for technical art history 6, 21 (2014)
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YBa2Cu3O7−xfilms with Ba2Y(Nb,Ta)O6nanoinclusions for high-field applications”. Celentano G, Rizzo F, Augieri A, Mancini A, Pinto V, Rufoloni A, Vannozzi A, MacManus-Driscoll JL, Feighan J, Kursumovic A, Meledin A, Mayer J, Van Tendeloo G, Superconductor Science &, Technology 33, 044010 (2020). http://doi.org/10.1088/1361-6668/ab6ee5
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YBa2Cu3O7-x Josephson junctions and dc SQUIDs based on 45\text{\textdegree} a-axis tilt and twist grain boundaries : atomically clean interfaces for applications”. Tafuri F, Carillo F, Lombardi F, Granozio FM, dii Uccio US, Testa G, Sarnelli E, Verbist K, Van Tendeloo G, Superconductor science and technology T2 –, International Superconductive Electronics Conference, JUN 21-25, 1999, BERKELEY, CALIFORNIA 12, 1007 (1999). http://doi.org/10.1088/0953-2048/12/11/393
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XRS activities at the Micro &, Trace Analysis Centre (MiTAC), University of Antwerp, Belgium”. Padilla R, Janssens K, van Espen P, Van Grieken R, IAEA XRF newsletter 12, 13 (2006)
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XRDUA : crystalline phase distribution maps by two-dimensional scanning and tomographic (micro) X-ray powder diffraction”. de Nolf W, Vanmeert F, Janssens K, Journal of applied crystallography 47, 1107 (2014). http://doi.org/10.1107/S1600576714008218
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers”. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films 343/344, 583 (1999). http://doi.org/10.1016/S0040-6090(99)00122-4
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Tsuji K, Injuk J, Van Grieken R (2004) X-ray spectrometry: recent technological advances. 616 p
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X-ray spectrometry for preventive conservation of cultural heritage”. Van Grieken R, Worobiec A, Pramåna: a journal of physics 72, 191 (2011). http://doi.org/10.1007/S12043-011-0041-3
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X-ray spectrometry for analysis of atmospheric particulate matter: detection limits versus legal levels”. Van Grieken R, Makarovska Y, van Meel K, Worobiec A page 153 (2007).
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X-ray spectrometry for air pollution and cultural heritage research”. Van Grieken R, Delalieux F, (2004)
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X-ray spectrometry applied for characterization of bricks of Brazilian historical sites”. Asfora VK, Bueno CC, de Barros VM, Khoury H, Van Grieken R, X-Ray Spectrometry , 1 (2020). http://doi.org/10.1002/XRS.3194
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
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X-ray spectrometry”. Van Grieken RE page 13269 (2000).
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X-ray spectrometry”. Török S, Labar J, Schmeling M, Van Grieken R, Analytical chemistry 70, 495r (1998)
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X-ray spectrometry”. Török SB, Labar J, Injuk J, Van Grieken RE, Analytical chemistry R68, 467 (1996)
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X-ray spectrometry”. Török SB, Van Grieken RE, Analytical chemistry 64r, 180 (1992)
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
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X-ray optics for synchrotron-radiation-induced X-ray micro fluorescence at the european synchrotron-radiation facility, Grenoble”. Vincze L, Janssens K, Adams F, Institute of physics conference series , 613 (1993)
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X-ray microanalysis: a new tool for environmental analysis”. Adams F, Janssens K page 183 (1996).
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X-ray micro-analysis of aluminium in pumpkinseed gills”. Eeckhaoudt S, Jacob W, Witters H, Van Grieken R, European journal of morphology 31, 42 (1993)
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