| Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Roelandts, T.; Batenburg, K.J.; Biermans, E.; Kübel, C.; Bals, S.; Sijbers, J. |
Accurate segmentation of dense nanoparticles by partially discrete electron tomography |
2012 |
Ultramicroscopy |
114 |
34 |
UA library record; WoS full record; WoS citing articles |
| Zhong, Z.; Goris, B.; Schoenmakers, R.; Bals, S.; Batenburg, K.J. |
A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEM |
2017 |
Ultramicroscopy |
174 |
26 |
UA library record; WoS full record; WoS citing articles |
| Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. |
3D imaging of nanomaterials by discrete tomography |
2009 |
Ultramicroscopy |
109 |
220 |
UA library record; WoS full record; WoS citing articles |
