Number of records found: 159
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Artificial atoms and molecules”. Partoens B, Peeters FM, Physicalia magazine 24, 29 (2002)
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Art 2002 : 7th International Conference on Non-destructive Testing and Microanalysisfor the Diagnostics and Conservation of the Cultural and Environmental Heritage, 2-6 June 2002, Congress Centre Elzenveld, Antwerp, Belgium”. Van Grieken R, Janssens K, Van 't dack L, Meersman G page 780 p. (2002).
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Applying digital image processing to SEM-EDX and BSE images to determine and quantify porosity and salts with depth in porous media”. Cardell C, Yebra A, Van Grieken RE, Microchimica acta 140, 9 (2002). http://doi.org/10.1007/S006040200063
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Application of thin-window EPMA to environmental problems in Hungary”. Osán J, Kurunczi S, Török S, Worobiec A, Van Grieken R, Microchimica acta 139, 111 (2002). http://doi.org/10.1007/S006040200048
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Anisotropic BaTiO3 thin films grown on MgO-buffered R-plane sapphire”. Lei CH, Van Tendeloo G, Philosophical magazine letters 82, 433 (2002). http://doi.org/10.1080/09500830210144373
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Airborne particles in the Miyagi Museum of Art in Sendai, Japan, studied by electron probe X-ray microanalysis and energy dispersive X-ray fluorescence analysis”. Injuk J, Osán J, Van Grieken R, Tsuji K, Analytical sciences : the international journal of the Japan Society for Analytical Chemistry 18, 561 (2002). http://doi.org/10.2116/ANALSCI.18.561
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A new structure type of the ternary sulfide Eu1.3Nb1.9S5”. Khasanova NR, Van Tendeloo G, Lebedev OI, Amelinckx S, Grippa AY, Abakumov AM, Istomin SY, D'yachenko OG, Antipov EV, Journal of solid state chemistry 164, 345 (2002). http://doi.org/10.1006/jssc.2001.9501
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A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence”. Kempenaers L, Janssens K, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Simionovici AS, Adams F, Analytical chemistry 74, 5017 (2002). http://doi.org/10.1021/AC025662G
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'Disordered' Ba(Mg1/3Ta2/3)O3 and its ordering transition”. Lei CH, Amelinckx S, Van Tendeloo G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 82, 2321 (2002). http://doi.org/10.1080/01418610210138969
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