Number of records found: 3074
 | 
Citations
 | 
   web
Metal and composite nanocluster precipitate formation in silicon dioxide implanted with Sb+ ions”. Ignatova VA, Lebedev OI, Watjen U, van Vaeck L, van Landuyt J, Gijbels R, Adams F, Journal of applied physics 92, 4336 (2002). http://doi.org/10.1063/1.1508425
toggle visibility
Mesoseopic ordering in the 0.9 Pb(Mg1/3Nb2/3)O3-0.1 PbTiO3 relaxor ferroelectric : a HRTEM study”. Nistor LC, Ghica C, Van Tendeloo G, Physica status solidi: C: conferences and critical reviews 4, 736 (2007). http://doi.org/10.1002/pssc.200673753
toggle visibility
Mesoporous material formed by acidic hydrothermal assembly of silicalite-1 precursor nanoparticles in the absence of meso-templates”. Stevens WJJ, Meynen V, Bruijn E, Lebedev OI, Van Tendeloo G, Cool P, Vansant EF, Microporous and mesoporous materials: zeolites, clays, carbons and related materials 110, 77 (2008). http://doi.org/10.1016/j.micromeso.2007.09.007
toggle visibility
Melting temperatures and possible precursor plastic phases of CCl4and GeI4as a function of pressure”. Matthai CC, Lamoen D, March NH, Physics and chemistry of liquids 54, 130 (2016). http://doi.org/10.1080/00319104.2015.1068666
toggle visibility
Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy”. Heidari H, Rivero G, Idrissi H, Ramachandran D, Cakir S, Egoavil R, Kurttepeli M, Crabbé, AC, Hauffman T, Terryn H, Du Prez F, Schryvers D, Microscopy and microanalysis 22, 1222 (2016). http://doi.org/10.1017/S1431927616012484
toggle visibility
Meer zien met onzichtbaar licht”. Van Aert S, Karakter : tijdschrift van wetenschap 18, 19 (2007)
toggle visibility
Mechanistic studies of gas reactions with multicomponent solids : what can we learn by combining NAP XPS and atomic resolution STEM/EDX?”.Sirotina AP, Callaert C, Volykhov AA, Frolov AS, Sanchez-Barriga J, Knop-Gericke A, Hadermann J, Yashina LV, The journal of physical chemistry: C : nanomaterials and interfaces 123, 26201 (2019). http://doi.org/10.1021/ACS.JPCC.9B05052
toggle visibility
Mechanistic Insight into the Photocatalytic Working of Fluorinated Anatase {001} Nanosheets”. Kus M, Altantzis T, Vercauteren S, Caretti I, Leenaerts O, Batenburg KJ, Mertens M, Meynen V, Partoens B, Van Doorslaer S, Bals S, Cool P, The journal of physical chemistry: C : nanomaterials and interfaces 121, 26275 (2017). http://doi.org/10.1021/acs.jpcc.7b05586
toggle visibility
Lumbeeck G (2019) Mechanisms of nano-plasticity in as-deposited and hydrided nanocrystalline Pd and Ni thin films. 130 p
toggle visibility
Mechanism of preferential orientation in sputter deposited titanium nitride and yttria-stabilized zirconia layers”. Mahieu S, Ghekiere P, de Winter G, Heirwegh S, Depla D, de Gryse R, Lebedev OI, Van Tendeloo G, Journal of crystal growth 279, 100 (2005). http://doi.org/10.1016/j.jcrysgro.2005.02.014
toggle visibility
Mechanism for Ohmic contact formation on Si3N4 passivated AlGaN/GaN high-electron-mobility transistors”. Van Daele B, Van Tendeloo G, Derluyn J, Shrivastava P, Lorenz A, Leys MR, Germain M;, Applied physics letters 89, Artn 201908 (2006). http://doi.org/10.1063/1.2388889
toggle visibility
Mechanical synthesis of high purity Cu-In-Se alloy nanopowder as precursor for printed CISe thin film solar cells”. Zaghi AE, Buffière M, Brammertz G, Batuk M, Lenaers N, Kniknie B, Hadermann J, Meuris M, Poortmans J, Vleugels J, Advanced powder technology 25, 1254 (2014). http://doi.org/10.1016/j.apt.2014.03.003
toggle visibility
Mechanical switching of nanoscale multiferroic phase boundaries”. Li YJ, Wang JJ, Ye JC, Ke XX, Gou GY, Wei Y, Xue F, Wang J, Wang CS, Peng RC, Deng XL, Yang Y, Ren XB, Chen LQ, Nan CW, Zhang JX;, Advanced functional materials 25, 3405 (2015). http://doi.org/10.1002/adfm.201500600
toggle visibility
Mechanical resonance of the austenite/martensite interface and the pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79”. Salje EKH, Zhang H, Idrissi H, Schryvers D, Carpenter MA, Moya X, Planes A, Physical review: B: condensed matter and materials physics 80, 134114 (2009). http://doi.org/10.1103/PhysRevB.80.134114
toggle visibility
Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films”. van der Rest A, Idrissi H, Henry F, Favache A, Schryvers D, Proost J, Raskin J-P, Van Overmeere Q, Pardoen T, Acta materialia 125, 27 (2017). http://doi.org/10.1016/j.actamat.2016.11.037
toggle visibility
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à, haute Tc”. Hervieu M, Michel C, Martin C, Huvé, M, Van Tendeloo G, Maignan A, Pelloquin D, Goutenoire F, Raveau B, Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4, 2057 (1994)
toggle visibility
Measuring the orbital angular momentum of electron beams”. Guzzinati G, Clark L, Béché, A, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 025803 (2014). http://doi.org/10.1103/PhysRevA.89.025803
toggle visibility
Measuring the height-to-height correlation function of corrugation in suspended graphene”. Kirilenko DA, Brunkov PN, Ultramicroscopy 165, 1 (2016). http://doi.org/10.1016/j.ultramic.2016.03.010
toggle visibility
Measuring the corrugation amplitude of suspended and supported graphene”. Kirilenko DA, Dideykin AT, Van Tendeloo G, Physical review : B : condensed matter and materials physics 84, 235417 (2011). http://doi.org/10.1103/PhysRevB.84.235417
toggle visibility
Measuring the absolute position of EELS ionisation edges in a TEM”. Potapov PL, Schryvers D, Ultramicroscopy 99, 73 (2004). http://doi.org/10.1016/S0304-3991(03)00185-2
toggle visibility
Measuring strain fields and concentration gradients around Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang ZQ;, Materials science and engineering A: structural materials properties microstructure and processing 438, 485 (2006). http://doi.org/10.1016/j.msea.2006.02.166
toggle visibility
Measuring porosity at the nanoscale by quantitative electron tomography”. Biermans E, Molina L, Batenburg KJ, Bals S, Van Tendeloo G, Nano letters 10, 5014 (2010). http://doi.org/10.1021/nl103172r
toggle visibility
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy”. Felten A, Gillon X, Gulas M, Pireaux J-J, Ke X, Van Tendeloo G, Bittencourt C, Najafi E, Hitchcock AP, ACS nano 4, 4431 (2010). http://doi.org/10.1021/nn1002248
toggle visibility
Measuring lattice strain in three dimensions through electron microscopy”. Goris B, de Beenhouwer J, de Backer A, Zanaga D, Batenburg KJ, Sánchez-Iglesias A, Liz-Marzán LM, Van Aert S, Bals S, Sijbers J, Van Tendeloo G, Nano letters 15, 6996 (2015). http://doi.org/10.1021/acs.nanolett.5b03008
toggle visibility
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy”. De wael A, De Backer A, Jones L, Varambhia A, Nellist PD, Van Aert S, Physical Review Letters 124, 106105 (2020). http://doi.org/10.1103/PhysRevLett.124.106105
toggle visibility
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering”. Hendrich C, Favre L, Ievlev DN, Dobrynin AN, Bras W, Hörmann U, Piscopiello E, Van Tendeloo G, Lievens P, Temst K, Applied physics A : materials science &, processing 86, 533 (2007). http://doi.org/10.1007/s00339-006-3808-5
toggle visibility
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Microscopy of Semiconducting Materials 107SPRINGER PROCEEDINGS IN PHYSICS, 303 (2005)
toggle visibility
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Waag A, Applied Physics Letters 86 (2005). http://doi.org/10.1063/1.1901820
toggle visibility
Measurement of the Indirect Band Gap of Diamond with EELS in STEM”. Korneychuk S, Guzzinati G, Verbeeck J, Physica status solidi : A : applications and materials science 215, 1800318 (2018). http://doi.org/10.1002/pssa.201800318
toggle visibility
Measurement of specimen thickness by phase change determination in TEM”. Croitoru MD, van Dyck D, Liu YZ, Zhang Z, Ultramicroscopy 108, 1616 (2008). http://doi.org/10.1016/j.ultramic.2008.06.002
toggle visibility