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Elemental abundance variation with particle-size in north florida aerosols”. Johansson TB, Van Grieken RE, Winchester JW, Journal of geophysical research 81, 1039 (1976). http://doi.org/10.1029/JC081I006P01039
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Electrostatically confined trilayer graphene quantum dots”. Mirzakhani M, Zarenia M, Vasilopoulos P, Peeters FM, Physical review B 95, 155434 (2017). http://doi.org/10.1103/PHYSREVB.95.155434
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Rahemi V (2018) Electrosensing applications by using titania as a support for bio(inspired) molecules. 133 p
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Milovanović, S (2017) Electronic transport properties in nano- and micro-engineered graphene structures. Antwerpen
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de Paula Miranda L (2022) Electronic transport in two dimensional systems with defects. 104 p
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Electronic structures of iMAX phases and their two-dimensional derivatives: A family of piezoelectric materials”. Khazaei M, Wang V, Sevik C, Ranjbar A, Arai M, Yunoki S, Physical review materials 2, 074002 (2018). http://doi.org/10.1103/PHYSREVMATERIALS.2.074002
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Mirzakhani M (2017) Electronic properties and energy levels of graphene quantum dots. Antwerpen
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Electronic and mechanical properties of stiff rhenium carbide monolayers: A first-principles investigation”. Siriwardane EMD, Karki P, Sevik C, Cakir D, Applied surface science 458, 762 (2018). http://doi.org/10.1016/J.APSUSC.2018.07.058
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Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism”. Poulain R, Lumbeeck G, Hunka J, Proost J, Savolainen H, Idrissi H, Schryvers D, Gauquelin N, Klein A, ACS applied electronic materials 4, 2718 (2022). http://doi.org/10.1021/ACSAELM.2C00230
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Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride”. Weill, Chevalier, Chambon, Tressaud, Darriet, Etourneau, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
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Electron-microscopy and the structural studies of superconducting materials and fullerites”. Van Tendeloo G, Amelinckx S, NATO Advanced Study Institutes series: series E : applied sciences T2 –, NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy , 521 (1994)
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Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM”. Muto S, Schryvers D, MRS Japan: shape memory materials 18, 853 (1993)
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Electron-hole superfluidity in strained Si/Ge type II heterojunctions”. Conti S, Saberi-Pouya S, Perali A, Virgilio M, Peeters FM, Hamilton AR, Scappucci G, Neilson D, npj Quantum Materials 6, 41 (2021). http://doi.org/10.1038/S41535-021-00344-3
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Electron-electron scattering induced capture in GaAs quantum wells”. Kálna K, Mo×ko M, Peeters FM, Lithuanian journal of physics 35, 435 (1995)
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Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals”. Goessens C, Schryvers D, van Dyck D, van Landuyt J, de Keyzer R, Physica status solidi: A 143, 277 (1994). http://doi.org/10.1002/pssa.2211430211
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Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes”. Moors K, Soree B, Tokei Z, Magnus W, On Ultimate Integration On Silicon (eurosoi-ulis) , 201 (2015)
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Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Valkovic V, Van Grieken R, Microchimica acta 128, 207 (1998). http://doi.org/10.1007/BF01243051
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Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Van Grieken R, Valkovic V page 29 (1996).
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Electron probe micro-analysis and laser microprobe mass analysis of material, leached from a limestone cathedral”. Leysen LA, De Waele JK, Roekens EJ, Van Grieken RE, Scanning microscopy 1, 1617 (1987)
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Electron pairing: from metastable electron pair to bipolaron”. Hai G-Q, Candido L, Brito BGA, Peeters FM, Journal of physics communications 2, Unsp 035017 (2018). http://doi.org/10.1088/2399-6528/AAAEE0
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Electron mobility in Si delta-doped GaAs”. Hai GQ, Studart N, Peeters FM, Devreese JT, Koenraad PM, van de Stadt AFW, Wolter JH, Proceedings of the International Conference on the Physics of Semiconductors 22, 823 (1994)
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Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite”. Schryvers D, van Landuyt JT, Proceedings Of The International Conference On Martensitic Transformations (icomat-92) , 263 (1993)
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Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 2: plate crystallography”. Schryvers D, Ma Y, Toth L, Tanner LE, Acta metallurgica et materialia 43, 4057 (1995). http://doi.org/10.1016/0956-7151(95)00102-2
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Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 1: precipitation and growth”. Schryvers D, Ma Y, Toth L, Tanner LE, Acta metallurgica et materialia 43, 4045 (1995). http://doi.org/10.1016/0956-7151(95)00101-Z
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Electron microscopy study of defects in synthetic diamond layers”. Luyten W, Van Tendeloo G, Amelinckx S, Collins JL, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 66, 899 (1992). http://doi.org/10.1080/01418619208247998
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Electron microscopy study of coiled carbon tubules”. Bernaerts D, Zhang XB, Zhang XF, Amelinckx S, Van Tendeloo G, van Landuyt J, Ivanov V, Nagy JB, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 71, 605 (1995). http://doi.org/10.1080/01418619508244470
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Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5”. Schryvers D, Tanner LE, Shape memory materials and phenomena: fundamental aspects and applications 246, 33 (1992)
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Electron microscopy of interfaces in new materials”. Van Tendeloo G, Goessens C, Schryvers D, van Haverbergh J, de Veirman A, van Landuyt J s.l., page 200 (1991).
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Electron microscopy of fullerenes and fullerene related structures”. Van Tendeloo G, van Landuyt J, Amelinckx S, , 498 (1994)
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Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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