“A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60”. Zhang XF, Zhang XB, Bernaerts D, Van Tendeloo G, Amelinckx S, van Landuyt J, Werner H, Ultramicroscopy 55, 25 (1994). http://doi.org/10.1016/0304-3991(94)90077-9
Abstract: In this paper a particularly simple but efficient method is presented by which samples of alkali-doped C-60 materials or other air-sensitive materials can be prepared and transferred into a transmission electron microscope for direct observations and investigations. Flexible, transparent glove bags are used which are filled to a slight overpressure with dry nitrogen. Under this protective atmosphere, the air-sensitive sample is mounted in the specimen holder and inserted in the vacuum of the electron microscope. Rb6C60 which is prepared and transferred into the microscope in this way has been investigated by transmission electron microscopy (TEM). The results confirm the bcc structure and especially the location of the rubidium atoms.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.436
Times cited: 2
DOI: 10.1016/0304-3991(94)90077-9
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“A peculiar diffraction effect in FCC crystals of C60”. Amelinckx S, van Heurck C, van Dyck D, Van Tendeloo G, Physica status solidi: A: applied research 131, 589 (1992). http://doi.org/10.1002/pssa.2211310231
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Times cited: 13
DOI: 10.1002/pssa.2211310231
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“A new structure type of the ternary sulfide Eu1.3Nb1.9S5”. Khasanova NR, Van Tendeloo G, Lebedev OI, Amelinckx S, Grippa AY, Abakumov AM, Istomin SY, D'yachenko OG, Antipov EV, Journal of solid state chemistry 164, 345 (2002). http://doi.org/10.1006/jssc.2001.9501
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 2
DOI: 10.1006/jssc.2001.9501
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“'Disordered' Ba(Mg1/3Ta2/3)O3 and its ordering transition”. Lei CH, Amelinckx S, Van Tendeloo G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 82, 2321 (2002). http://doi.org/10.1080/01418610210138969
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 5
DOI: 10.1080/01418610210138969
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