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Author
Title
Year
Publication
Volume
Times cited
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De Backer, A.
;
Van Aert, S.
;
Faes, C.
;
Arslan Irmak, E.
;
Nellist, P.D.
;
Jones, L.
Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm
2022
N P J Computational Materials
8
UA library record
;
WoS full record
;
WoS citing articles
Lobato, I.
;
Friedrich, T.
;
Van Aert, S.
Deep convolutional neural networks to restore single-shot electron microscopy images
2024
N P J Computational Materials
10
UA library record
;
WoS full record
;
WoS citing articles