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Author |
van der Linden, V.; Schalm, O.; Houbraken, J.; Thomas, M.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Janssens, K. |
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Title |
Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries |
Type |
A1 Journal article |
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Year |
2010 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
39 |
Issue |
2 |
Pages |
112-121 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
In this study, the results of analysing of a series of 16th-19th century painted enamel objects of the Limoges School currently in collections in three Dutch and Flemish museums by means of portable and micro x-ray fluorescence analysis (PXRF and µ-XRF) and electron probe micro analysis (EPMA) are presented. The aim of the investigation was the authentication of specific pieces. Therefore, the glass compositions as well as the (glass) colouring agents used by the Limoges' artists were studied as a function of the age of the objects. Due to the evolution of these properties, it is possible to approximately date these objects based on their chemical composition. The complete émail peint collection of the Museum Boijmans-Van Beuningen (Rotterdam, The Netherlands), consisting of 20 émail peint plaques, was analysed with µ-XRF. Quantitative information was obtained by EPMA analysis of 15 enamel fragments of objects from museum and private collections in the Low Countries. PXRF analyses were performed on the painted enamel collection of the Antwerp Vleeshuis Museum (13 objects) and the Mayer van den Bergh Museum (4 objects) and on a set of 18 plaques that were donated to the Boijmans-Van Beuningen Museum by a private collector. The results obtained by means of EPMA, µ-XRF and PXRF proved to be useful in the discrimination of 16th century painted enamel objects from those of the19th century. From a total of 70 objects examined, 2 objects (OM964A and OM993) featured a chemical signature that deviated from the published literature composition and pigment use consistent with its presumed period of manufacture. |
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Wos |
000275959400007 |
Publication Date |
2009-08-11 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.298 |
Times cited |
8 |
Open Access |
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Notes |
; ; |
Approved |
Most recent IF: 1.298; 2010 IF: 1.661 |
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Call Number |
UA @ admin @ c:irua:82325 |
Serial |
5509 |
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Permanent link to this record |
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Author |
Proost, K.; Vincze, L.; Janssens, K.; Gao, N.; Bulska, E.; Schreiner, M.; Falkenberg, G. |
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Title |
Characterization of a polycapillary lens for use in micro-XANES experiments |
Type |
A1 Journal article |
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Year |
2003 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
32 |
Issue |
3 |
Pages |
215-222 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
000183630400007 |
Publication Date |
2003-06-12 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.298 |
Times cited |
50 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.298; 2003 IF: 1.227 |
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Call Number |
UA @ admin @ c:irua:41804 |
Serial |
5502 |
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Author |
Van Grieken, R. |
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Title |
Awards for best referees of X-ray Spectrometry |
Type |
Editorial |
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Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
43 |
Issue |
2 |
Pages |
68-69 |
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Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
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Publication Date |
2014-02-07 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:114471 |
Serial |
7542 |
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Permanent link to this record |
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Author |
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
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Title |
Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal |
Type |
A1 Journal article |
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Year |
1980 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
9 |
Issue |
2 |
Pages |
70-76 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
A method has been investigated which allows calculations from the X-ray fluorescence spectra of the absorption coefficients at any energy for any sample, without any additional measurement. Use is made of the ratio of the characteristic X-ray signals from a Zr wire positioned in front of the sample and from a Pd foil placed behind the sample, both in a fixed geometry. From the experimentally measured absorption coefficient at the Pd L energy (2.9 keV), the coefficients for higher energies are calculated. By the use of an iterative computer routine in which corrections for the enhancement of the Pd foil by the sample are also included, an accuracy of 2% or better on the absorption coefficient determination can be reached for homogenous samples in one measurement. Grain-size and heterogeneity effects induce inaccuracies on the absorption coefficient determinations which might well reach 20% for particulate samples like intermediate thickness deposits of geological materials. This approach thus has the same limitations as the classical transmission method for such heterogeneous samples. |
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Wos |
A1980JN16500007 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:116483 |
Serial |
7541 |
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Permanent link to this record |
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Author |
Vekemans, B.; Janssens, K.; Vincze, L.; Aerts, A.; Adams, F.; Hertogen, J. |
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Title |
Automated segmentation of μ-XRF image sets |
Type |
A1 Journal article |
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Year |
1997 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
26 |
Issue |
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Pages |
333-346 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
A1997YG79300005 |
Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.298 |
Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: 1.298; 1997 IF: 1.307 |
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Call Number |
UA @ admin @ c:irua:18319 |
Serial |
5486 |
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Permanent link to this record |
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Author |
Van Dyck, P.; Van Grieken, R. |
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Title |
Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution |
Type |
A1 Journal article |
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Year |
1983 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
12 |
Issue |
3 |
Pages |
111-114 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Most computer XRF-spectrum deconvolution routines make use of fixed intensity ratios for the lines from one element. The magnitude of the error that fixed ratios imply has been quantitatively evaluated for samples with a varible thickness or matrix. A procedure for routinely adapting the line ratios according to the matrix effect in every sample (by making use of the matrix information present in the scatter peaks) enhances the accuracy of the spectrum evaluation. |
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Wos |
A1983RA69700004 |
Publication Date |
2005-05-28 |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:116484 |
Serial |
7539 |
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Permanent link to this record |
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Author |
Godoi, R.H.M.; Potgieter-Vermaak, S.; Godoi, A.F.L.; Stranger, M.; Van Grieken, R. |
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Title |
Assessment of aerosol particles within the Rubens' House Museum in Antwerp, Belgium |
Type |
A1 Journal article |
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Year |
2008 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
37 |
Issue |
4 |
Pages |
298-303 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
The majority of researchers, conservators and curators recognise that atmospheric pollution is one of the major threats to works of art. In principle, all atmospheric particles, when deposited onto art objects can be considered harmful because of their potential in causing deterioration. Moreover, under certain conditions, particulate matter can induce and intensify surface damage, particularly because of its potential to serve as centre for moisture condensation and adsorbent of gaseous pollutants. To investigate the potential harm that these particles can cause, comprehensive characterisation of the particulate matter is necessary. Particulate matter was collected at the Rubens' House Museum in Antwerp, Belgium, where a unique exhibit of the paintings and living quarters of Peter Paul Rubens (1577-1640) are seen. Size segregated aerosol samples were collected for analyses of bulk and single particle elemental and molecular compositions. They were analysed by electron probe micro-analysis, utilising facilities for low-Z element determination, and by energy-dispersive x-ray fluorescence, to investigate the elemental composition of individual particles and bulk samples, and by micro Raman spectrometry, to elucidate the molecular composition. Results are interpreted separately and as a whole with the specific aim of identifying compounds that could contribute to the chemical reactions taking place on the surfaces of artefacts and which could potentially cause degradation of the objects. |
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Wos |
000258670600004 |
Publication Date |
2008-03-10 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:69494 |
Serial |
7499 |
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Permanent link to this record |
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Author |
Kuczumov, A.; Vekemans, B.; Schalm, O.; Vincze, L.; Dorriné, W.; Gysels, K.; Van Grieken, R. |
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Title |
Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation |
Type |
A1 Journal article |
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Year |
1999 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
28 |
Issue |
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Pages |
282-291 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Corporate Author |
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Thesis |
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Place of Publication |
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Wos |
000081693400014 |
Publication Date |
2002-09-10 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:27584 |
Serial |
7467 |
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Permanent link to this record |
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Author |
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. |
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Title |
Analysis of X-ray spectra by iterative least squares (AXIL): new developments |
Type |
A1 Journal article |
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Year |
1994 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
23 |
Issue |
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Pages |
278-285 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
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Corporate Author |
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Publisher |
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Place of Publication |
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Language |
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Wos |
A1994QF68500008 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:8933 |
Serial |
5471 |
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Permanent link to this record |
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Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
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Title |
A simple absorption correction for electron probe X-ray microanalysis of bulk samples |
Type |
A1 Journal article |
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Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
2 |
Pages |
115-119 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages. |
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Wos |
A1986C017300007 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:113872 |
Serial |
8524 |
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Permanent link to this record |
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Author |
Van Grieken, R. |
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Title |
2014 Award for best referee of X-Ray Spectrometry |
Type |
Editorial |
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Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
43 |
Issue |
6 |
Pages |
311-311 |
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Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Corporate Author |
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Wos |
000344178700001 |
Publication Date |
2014-09-27 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:121210 |
Serial |
7385 |
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Permanent link to this record |