Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Oleshko, V.; Kindratenko, V.; Gijbels, R.; van Espen, P.; Jacob, W. |
Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis |
1996 |
Mikrochimica acta: supplementum |
13 |
|
UA library record; WoS full record; |
Leyva Pernia, D.; Cabal Rodríguez, A.E.; Schalm, O.; van Espen, P.; Piñera Hernández, I.; Abreu Alfonso, Y. |
Study of the main physical processes contributing to image formation in emission radiography using mathematical modeling |
2013 |
|
|
|
UA library record |
Cabal, A.; Legrand, S.; Van den Bril, B.; Tote, K.; Janssens, K.; van Espen, P. |
Study of the uniformity of aerosol filters by scanning MA-XRF |
2017 |
X-ray spectrometry
T2 – 17th European Conference on X-Ray Spectrometry (EXRS), JUN 19-24, 2016, Univ Gothenburg, Univ Gothenburg, Gothenburg, SWEDEN |
46 |
4 |
UA library record; WoS full record; WoS citing articles |
Treiger, B.; van Malderen, H.; Bondarenko, I.; van Espen, P.; Van Grieken, R. |
Studying aerosol samples by non-linear mapping of electron probe microanalysis data |
1993 |
Analytica chimica acta |
284 |
|
UA library record; WoS full record; WoS citing articles |
Maenhaut, W.; Selen, A.; van Espen, P.; Van Grieken, R.; Winchester, J.W. |
Sulfur and heavy metals over the Atlantic Ocean : comparison with other marine data |
1980 |
|
|
|
UA library record |
Janssens, K.; Dorrine, W.; van Espen, P. |
The development process of an expert system for the automated interpretation of large epma data sets |
1988 |
Chemometrics and intelligent laboratory systems |
4 |
|
UA library record; WoS full record; WoS citing articles |
Rojas, C.M.; Figueroa, L.; Janssens, K.H.; Van Espen, P.E.; Adams, F.C.; Van Grieken, R.E. |
The elemental composition of airborne particulate matter in the Atacama desert, Chile |
1990 |
The science of the total environment |
91 |
|
UA library record; WoS full record; WoS citing articles |
Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. |
The primary energy dependence of backscattered electron images up to 100 keV |
1991 |
Scanning microscopy |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. |
Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis |
1997 |
Analytical chemistry |
69 |
6 |
UA library record; WoS full record; WoS citing articles |
Van Echelpoel, R.; de Jong, M.; Daems, D.; van Espen, P.; De Wael, K. |
Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications |
2021 |
Talanta |
233 |
|
UA library record; WoS full record; WoS citing articles |
Padilla, R.; Janssens, K.; van Espen, P.; Van Grieken, R. |
XRS activities at the Micro & Trace Analysis Centre (MiTAC), University of Antwerp, Belgium |
2006 |
IAEA XRF newsletter |
12 |
|
UA library record |