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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
|
|
Mahr, C.; Müller-Caspary, K.; Graf, M.; Lackmann, A.; Grieb, T.; Schowalter, M.; Krause, F.F.; Mehrtens, T.; Wittstock, A.; Weissmueller, J.; Rosenauer, A. |
Measurement of local crystal lattice strain variations in dealloyed nanoporous gold |
2018 |
Materials research letters |
6 |
4 |
UA library record; WoS full record; WoS citing articles |
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
|
UA library record; WoS full record; |
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Applied Physics Letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga1-xInxAs/GaAs quantum wells |
2009 |
Journal of applied physics |
105 |
|
UA library record; WoS full record |
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Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. |
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images |
2014 |
Applied physics letters |
105 |
12 |
UA library record; WoS full record; WoS citing articles |
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Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
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Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. |
Procedure to count atoms with trustworthy single-atom sensitivity |
2013 |
Physical review : B : condensed matter and materials physics |
87 |
106 |
UA library record; WoS full record; WoS citing articles |
|
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Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy |
2014 |
Ultramicroscopy |
137 |
74 |
UA library record; WoS full record; WoS citing articles |
|
|
Mahr, C.; Kundu, P.; Lackmann, A.; Zanaga, D.; Thiel, K.; Schowalter, M.; Schwan, M.; Bals, S.; Wittstock, A.; Rosenauer, A. |
Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performance |
2017 |
Journal of catalysis |
352 |
42 |
UA library record; WoS full record; WoS citing articles |
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Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
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Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. |
Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction |
2010 |
Journal of physics : conference series |
209 |
|
UA library record |
|
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Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. |
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data |
2009 |
Ultramicroscopy |
109 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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Piscopiello, E.; Rosenauer, A.; Passaseo, A.; Montoya Rossi, E.H.; Van Tendeloo, G. |
Segregation in InxGa1-xAs/GaAs Stranski-Krastanow layers grown by metal-organic chemical vapour deposition |
2005 |
Philosophical magazine |
85 |
11 |
UA library record; WoS full record; WoS citing articles |
|
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Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Size effects and strain state of Ga1-xInxAs/GaAs multiple quantum wells: Monte Carlo study |
2008 |
Physical review : B : condensed matter and materials physics |
78 |
5 |
UA library record; WoS full record; WoS citing articles |
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Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. |
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence |
2018 |
Ultramicroscopy |
190 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Temperature effect on the 002 structure factor of ternary Ga1-xInxAs crystals |
2007 |
Physical review : B : condensed matter and materials physics |
76 |
3 |
UA library record; WoS full record; WoS citing articles |
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Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. |
Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structure |
2009 |
Acta crystallographica: section A: foundations of crystallography |
65 |
23 |
UA library record; WoS full record; WoS citing articles |
|
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Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
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