Number of records found: 3074
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Advanced particle characterization techniques”. Liz-Marzan L, Bals S, Particle and particle systems characterization 33, 350 (2016). http://doi.org/10.1002/ppsc.201600137
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Advanced imaging and simulations of precipitate interfaces in aluminium alloys and their role in phase transformations”. Zhang Z, Bourgeois L, Zhang Y, Rosalie JM, Medhekar N, MATEC web of conferences T2 –, 17th International Conference on Aluminium Alloys (ICAA), October 26-29, 2020 , 09003 (2020). http://doi.org/10.1051/MATECCONF/202032609003
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Pedrazo Tardajos A (2021) Advanced graphene supports for 3D in situ transmission electron microscopy. 247 p
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Winckelmans N (2018) Advanced electron tomography to investigate the growth of homogeneous and heterogeneous nanoparticles. Antwerpen
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Mychinko M (2024) Advanced Electron Tomography to Investigate the Growth and Stability of Complex Metal Nanoparticles = Geavanceerde Elektronentomografie om de Groei en Stabiliteit van Complexe Metallische Nanodeeltjes te Onderzoeken. 227 p
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Advanced electron tomography of nanoparticle assemblies”. Altantzis T, Zanaga D, Bals S, Europhysics letters 119, 38001 (2017). http://doi.org/10.1209/0295-5075/119/38001
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Goris B (2014) Advanced electron tomography : 3 dimensional structural characterisation of nanomaterials down to the atomic scale. Antwerpen
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Advanced electron microscopy for advanced materials”. Van Tendeloo G, Bals S, Van Aert S, Verbeeck J, van Dyck D, Advanced materials 24, 5655 (2012). http://doi.org/10.1002/adma.201202107
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Meledina M (2016) Advanced electron microscopy characterization of catalysts. Antwerpen
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Advanced electron microscopy characterisation of important precipitation and ordering phenomena in shape memory systems”. Schryvers D, Shape memory and superelasticity 1, 78 (2015). http://doi.org/10.1007/s40830-015-0006-3
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Advanced electron microscopy and its possibilities to solve complex structures: application to transition metal oxides”. Van Tendeloo G, Hadermann J, Abakumov AM, Antipov EV, Journal of materials chemistry 19, 2660 (2009). http://doi.org/10.1039/b817914j
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Zanaga D (2017) Advanced algorithms for quantitative electron tomography. Antwerpen
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Adsorption of sulfur onto a surface of silver nanoparticles stabilized with sago starch biopolymer”. Djoković, V, Krsmanović, R, Božanić, DK, McPherson M, Van Tendeloo G, Nair PS, Georges MK, Radhakrishnan T, Colloids and surfaces: B : biointerfaces 73, 30 (2009). http://doi.org/10.1016/j.colsurfb.2009.04.022
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Adsorption of potassium and oxygen on graphite: a theoretical study”. Lamoen D, Persson BNJ, Journal Of Chemical Physics 108, 3332 (1998). http://doi.org/10.1063/1.475732
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ADJUST : a dictionary-based joint reconstruction and unmixing method for spectral tomography”. Zeegers MT, Kadu A, van Leeuwen T, Batenburg KJ, Inverse problems 38, 125002 (2022). http://doi.org/10.1088/1361-6420/AC932E
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Additivity of Atomic Strain Fields as a Tool to Strain-Engineering Phase-Stabilized CsPbI3Perovskites”. Teunissen JL, Braeckevelt T, Skvortsova I, Guo J, Pradhan B, Debroye E, Roeffaers MBJ, Hofkens J, Van Aert S, Bals S, Rogge SMJ, Van Speybroeck V, The Journal of Physical Chemistry C 127, 23400 (2023). http://doi.org/10.1021/acs.jpcc.3c05770
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Addition of yttrium into HfO2 films: microstructure and electrical properties”. Dubourdieu C, Rauwel E, Roussel H, Ducroquet F, Hollaender B, Rossell M, Van Tendeloo G, Lhostis S, Rushworth S, Journal of vacuum science and technology: A: vacuum surfaces and films 27, 503 (2009). http://doi.org/10.1116/1.3106627
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Amin-Ahmadi B (2015) Adanced TEM investigation of the elementary plsticity mechanisms in palladium thin films at the nano scale. Antwerpen
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Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
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Acoustic vibration modes and electron-lattice coupling in self-assembled silver nanocolumns”. Burgin J, Langot P, Arbouet A, Margueritat J, Gonzalo J, Afonso CN, Vallee F, Mlayah A, Rossell MD, Van Tendeloo G, Nano letters 8, 1296 (2008). http://doi.org/10.1021/nl073123r
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Achieving independent control of core diameter and carbon shell thickness in Pd-C core–shell nanoparticles by gas phase synthesis”. Singh V, Mehta BR, Sengar SK, Karakulina OM, Hadermann J, Kaushal A, Nanotechnology 28, 295603 (2017). http://doi.org/10.1088/1361-6528/aa7660
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Achieving High Moisture Tolerance in Pseudohalide Perovskite Nanocrystals for Light-Emitting Diode Application”. Bhatia H, Keshavarz M, Martin C, Van Gaal L, Zhang Y, de Coen B, Schrenker NJ, Valli D, Ottesen M, Bremholm M, Van de Vondel J, Bals S, Hofkens J, Debroye E, ACS Applied Optical Materials 1, 1184 (2023). http://doi.org/10.1021/acsaom.3c00096
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Accurate segmentation of dense nanoparticles by partially discrete electron tomography”. Roelandts T, Batenburg KJ, Biermans E, Kübel C, Bals S, Sijbers J, Ultramicroscopy 114, 96 (2012). http://doi.org/10.1016/j.ultramic.2011.12.003
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Accurate pseudopotential description of the GW bandstructure of ZnO”. Dixit H, Saniz R, Lamoen D, Partoens B, Computer physics communications 182, 2029 (2011). http://doi.org/10.1016/j.cpc.2011.02.001
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Lobato I (2014) Accurate modeling of high angle electron scattering. Antwerpen
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Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000).
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Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon”. de Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, The review of scientific instruments 70, 3661 (1999). http://doi.org/10.1063/1.1149974
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Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers”. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering 45, 277 (1999). http://doi.org/10.1016/S0167-9317(99)00180-X
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Accurate description of the van der Waals interaction of an electron-positron pair with the surface of a topological insulator”. Saniz R, Vercauteren S, Lamoen D, Partoens B, Barbiellini B, Journal of physics : conference series 505, 012002 (2014). http://doi.org/10.1088/1742-6596/505/1/012002
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