Number of records found: 138
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Citations
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Symmetry breaking of the admittance of a classical two-dimensional electron system in a magnetic field”. Sommerfeld PKH, van der Heijden RW, Peeters FM, Physical review : B : condensed matter and materials physics 53, R13250 (1996). http://doi.org/10.1103/PhysRevB.53.R13250
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Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
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TEM characterization of structural defects”. Van Tendeloo G Plenum Press, New York, page 473 (1996).
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The chirality of carbon nanotubules determined by dark-field electron microscopy”. Bernaerts D, op de Beeck M, Amelinckx S, van Landuyt J, Van Tendeloo G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 74, 723 (1996). http://doi.org/10.1080/01418619608243538
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The crystal structure of Ba8Ta6NiO24: cation ordering in hexagonal perovskites”. Abakumov AM, Van Tendeloo G, Scheglov AA, Shpanchenko RV, Antipov EV, Journal of solid state chemistry 125, 102 (1996). http://doi.org/10.1006/jssc.1996.0270
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The paraelectric-ferroelectric phase transition of Bi4Ti3O12 studied by electron microscopy”. Nistor L, Van Tendeloo G, Amelinckx S, Phase transitions 59, 135 (1996)
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The polaron-bipolaron transition for acoustical three-dimensional polarons”. da Costa WB, Peeters FM, Journal of physics : condensed matter 8, 2173 (1996). http://doi.org/10.1088/0953-8984/8/13/009
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The study of a crater forming on the surface of a Ti target submitted to multipulse excimer laser irradiation under low pressure N2”. Teodorescu VS, Mihailescu IN, Gyorgy E, Luches A, Martino M, Nistor LC, van Landuyt J, Hermann J, Journal of modern optics 43, 1773 (1996). http://doi.org/10.1080/095003496154815
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The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions”. Schelles W, de Gendt S, Maes K, Van Grieken R, Fresenius' journal of analytical chemistry 355, 858 (1996). http://doi.org/10.1007/S0021663550858
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Theoretical investigation of CoSi2/Si1-xGex detectors: influence of a Si tunneling barrier on the electro-optical characteristics”. Chu DP, Peeters FM, Kolodinski S, Roca E, Journal of applied physics 79, 1151 (1996)
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Two electron quantum disks”. Peeters FM, Schweigert VA, Physical review : B : condensed matter and materials physics 53, 1468 (1996). http://doi.org/10.1103/PhysRevB.53.1468
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Two-dimensional electrons in modulated magnetic fields”. Peeters FM, Matulis A, Ibrahim IS, Physica: B : condensed matter 227, 131 (1996). http://doi.org/10.1016/0921-4526(96)00381-X
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Two-dimensional model of a direct current glow discharge : description of the argon metastable atoms, sputtered atoms and ions”. Bogaerts A, Gijbels R, Analytical chemistry 68, 2676 (1996). http://doi.org/10.1021/ac951206z
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Two-dimensional model of a direct current glow discharge: description of the electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer WJ, Analytical chemistry 68, 2296 (1996). http://doi.org/10.1021/ac9510651
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Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements”. de Gendt S, Kenis K, Mertens PW, Heyns MM, Claes M, Van Grieken RE, Bailleul A, Knotter M, de Bokx PK, (1996)
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Vortex structure around a magnetic dot in planar superconductors”. Marmorkos IK, Matulis A, Peeters FM, Physical review : B : condensed matter and materials physics 53, 2677 (1996). http://doi.org/10.1103/PhysRevB.53.2677
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X-ray microanalysis: a new tool for environmental analysis”. Adams F, Janssens K page 183 (1996).
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X-ray spectrometry”. Török SB, Labar J, Injuk J, Van Grieken RE, Analytical chemistry R68, 467 (1996)
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