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Author
Title
Year
Publication
Volume
Times cited
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Van Dyck, P.
;
Markowicz, A.
;
Van Grieken, R.
Influence of sample thickness, excitation energy and geometry on particle size effects in XRF
1985
X-ray spectrometry
14
UA library record
;
WoS full record
;
WoS citing articles
Van Dyck, P.
;
Markowicz, A.
;
Van Grieken, R.
Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal
1980
X-ray spectrometry
9
UA library record
;
WoS full record
;
WoS citing articles