| Records |
| Author |
Verbeeck, J.; Bertoni, G. |
Title  |
Deconvolution of core electron energy loss spectra |
Type |
A1 Journal article |
| Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
109 |
Issue |
11 |
Pages |
1343-1352 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
Different deconvolution methods for removing multiple scattering and instrumental broadening from core loss electron energy loss spectra are compared with special attention to the artefacts they introduce. The Gaussian modifier method, Wiener filter, maximum entropy, and model based methods are described. Their performance is compared on virtual spectra where the true single scattering distribution is known. A test on experimental spectra confirms the good performance of model based deconvolution in comparison to maximum entropy methods and shows the advantage of knowing the estimated error bars from a single spectrum acquisition. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Amsterdam |
Editor |
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| Language |
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Wos |
000270765800005 |
Publication Date |
2009-07-01 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
13 |
Open Access |
|
| Notes |
Fwo; Esteem 026019 |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
| Call Number |
UA @ lucian @ c:irua:79073UA @ admin @ c:irua:79073 |
Serial |
610 |
| Permanent link to this record |
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| Author |
Verbeeck, J.; Bertoni, G. |
| Title |
Model-based quantification of EELS spectra: treating the effect of correlated noise |
Type |
A1 Journal article |
| Year |
2008 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
108 |
Issue |
2 |
Pages |
74-83 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
Correlated noise is generally present in experimentally recorded electron energy loss spectra due to a non-ideal electron detector. In this contribution we describe a method to experimentally measure the noise properties of the detector as well as the consequences it has for model-based quantification using maximum likelihood. The effect of the correlated noise on the maximum likelihood fitting results can be shown to be negligible for the estimated (co)variance of the parameters while an experimentally obtained scaling factor is required to correct the likelihood ratio test for the reduction of noise power with frequency. Both effects are derived theoretically under a set of approximations and tested for a range of signal-to-noise values using numerical experiments. Finally, an experimental example shows that the correction for correlated noise is essential and should always be included in the fitting procedure. (c) 2007 Elsevier B.V. All rights reserved. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Amsterdam |
Editor |
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| Language |
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Wos |
000252816900002 |
Publication Date |
2007-03-25 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
16 |
Open Access |
|
| Notes |
FWO nr G.0147.06; ESTEEM 026019 |
Approved |
Most recent IF: 2.843; 2008 IF: 2.629 |
| Call Number |
UA @ lucian @ c:irua:67602UA @ admin @ c:irua:67602 |
Serial |
2103 |
| Permanent link to this record |
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| Author |
Verbeeck, J.; Bertoni, G. |
| Title |
Model-based quantification of EELS: is standardless quantification possible? |
Type |
A1 Journal article |
| Year |
2008 |
Publication |
Microchimica acta |
Abbreviated Journal |
Microchim Acta |
| Volume |
161 |
Issue |
3/4 |
Pages |
439-443 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
Electron energy loss spectroscopy (EELS) is an ideal tool to obtain chemical information from nanoscale volumes. Quantification of the experimental spectra however has prevented for a long time access to the available information in a reliable and reproducible way. We present recent advances in model-based quantification of EELS spectra and show that we obtain the best possible precision for a given dataset, as well as remarkably good accuracies when applied to three different materials. The results are shown to be far superior over conventional quantification techniques and could hold a promise for standardless quantification of EELS spectra. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
000256175600024 |
Publication Date |
2008-02-22 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0026-3672;1436-5073; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
4.58 |
Times cited |
5 |
Open Access |
|
| Notes |
Esteem 026019; Fwo; G.0425.05; Iap V; Goa 2005 |
Approved |
Most recent IF: 4.58; 2008 IF: 1.910 |
| Call Number |
UA @ lucian @ c:irua:69292UA @ admin @ c:irua:69292 |
Serial |
2100 |
| Permanent link to this record |
