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Author | Hoornaert, S.; Treiger, B.; Van Grieken, R.; Valkovic, V. | ||||
Title ![]() |
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level | Type | H3 Book chapter | ||
Year | 1996 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 29-49b T2 - Reference materials for microanalytica | ||
Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | |||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ admin @ c:irua:14681 | Serial | 7874 | ||
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