|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
|
Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R.; Leys, C. |
Particle-in-cell Monte Carlo modeling of Langmuir probes in an Ar plasma |
2005 |
Journal of applied physics |
97 |
18 |
UA library record; WoS full record; WoS citing articles |
|
Martin, J.M.L.; Francois; Gijbels, R. |
The anharmonic-force field of thioformaldehyde, h2cs, by ab-initio methods |
1994 |
Journal of molecular spectroscopy |
168 |
18 |
UA library record; WoS full record; WoS citing articles |
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
Ab initio spectroscopy and thermochemistry of the BN molecule |
1991 |
Zeitschrift für Physik : D : atoms, molecules and clusters |
21 |
17 |
UA library record; WoS full record; WoS citing articles |
|
van Straaten, M.; Swenters, K.; Gijbels, R.; Verlinden, J.; Adriaenssens, E. |
Analysis of platinum powder by glow discharge mass spectrometry |
1994 |
Journal of analytical atomic spectrometry |
9 |
17 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Gijbels, R. |
Behavior of the sputtered copper atoms, ions and excited species in a radio-frequency and direct current glow discharge |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
17 |
UA library record; WoS full record; WoS citing articles |
|
Struyf, H.; van Roy, W.; van Vaeck, L.; van Grieken, R.; Gijbels, R.; Caravatti, P. |
Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis |
1993 |
Analytica chimica acta |
283 |
17 |
UA library record; WoS full record; WoS citing articles |
|
Claereboudt, J.; Claeys, M.; Geise, H.; Gijbels, R.; Vertes, A. |
Laser microprobe mass spectrometry of quaternary phosphonium salts: direct versus matrix-assisted laser desorption |
1993 |
Journal of the American Society for Mass Spectrometry |
4 |
17 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Gijbels, R. |
New developments and applications in GDMS |
1999 |
Fresenius' journal of analytical chemistry |
364 |
17 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Wilken, L.; Hoffmann, V.; Gijbels, R.; Wetzig, K. |
Comparison of modeling calculations with experimental results for direct current glow discharge optical emission spectrometry |
2001 |
Spectrochimica acta: part B : atomic spectroscopy |
56 |
16 |
UA library record; WoS full record; WoS citing articles |
|
Gijbels, R.; Dams, R. |
Determination of silicon in natural and pollution aerosols by 14-MeV neutron activation analysis |
1973 |
Analytica chimica acta |
63 |
16 |
UA library record; WoS full record; WoS citing articles |
|
de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon |
2001 |
Journal of applied physics |
89 |
16 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Gijbels, R. |
Numerical modelling of gas discharge plasmas for various applications |
2003 |
Vacuum: surface engineering, surface instrumentation & vacuum technology |
69 |
16 |
UA library record; WoS full record; WoS citing articles |
|
Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. |
Unveiling the composition of sulphur sensitization specks by their interactions with TAI |
2000 |
Journal Of Imaging Science And Technology |
44 |
16 |
UA library record; WoS full record; WoS citing articles |
|
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks |
2003 |
Applied surface science |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
|
Herrebout, D.; Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W.; Vanhulsel, A. |
Modeling of a capacitively coupled radio-frequency methane plasma: comparison between a one-dimensional and a two-dimensional fluid model |
2002 |
Journal of applied physics |
92 |
15 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Gijbels, R. |
Modeling of glow discharge sources with flat and pin cathodes and implications for mass spectrometric analysis |
1997 |
Journal of the American Society of Mass Spectrometry |
8 |
15 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Gijbels, R. |
Monte Carlo model for the argon ions and fast argon atoms in a radio-frequency discharge |
1999 |
IEEE transactions on plasma science |
27 |
15 |
UA library record; WoS full record; WoS citing articles |
|
Neyts, E.; Yan, M.; Bogaerts, A.; Gijbels, R. |
Particle-in-cell/Monte Carlo simulations of a low-pressure capacitively coupled radio-frequency discharge: effect of adding H2 to an Ar discharge |
2003 |
Journal of applied physics |
93 |
15 |
UA library record; WoS full record; WoS citing articles |
|
Martin, J.M.L.; Taylor, P.R.; François, J.P.; Gijbels, R. |
Ab initio study of the spectroscopy, kinetics, and thermochemistry of the BN2 molecule |
1994 |
Chemical physics letters |
222 |
14 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Wilken, L.; Hoffmann, V.; Gijbels, R.; Wetzig, K. |
Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
14 |
UA library record; WoS full record; WoS citing articles |
|
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces |
2000 |
Journal of the electrochemical society |
147 |
14 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Chen, Z.; Gijbels, R. |
Glow discharge modelling: from basic understanding towards applications |
2003 |
Surface and interface analysis |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
|
van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Internal standard activation analysis of silicon in steel |
1968 |
Analytica chimica acta |
43 |
14 |
UA library record; WoS full record; WoS citing articles |
|
Yan, M.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J. |
Spatial behavior of energy relaxation of electrons in capacitively coupled discharges: comparison between Ar and SiH4 |
2000 |
Journal of applied physics |
87 |
14 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Gijbels, R. |
Comparison of argon and neon as discharge gases in a direct current glow discharge: a mathematical simulation |
1997 |
Spectrochimica acta: part B : atomic spectroscopy |
52 |
13 |
UA library record; WoS full record; WoS citing articles |
|
Depla, D.; Chen, Z.Y.; Bogaerts, A.; Ignatova, V.; de Gryse, R.; Gijbels, R. |
Modeling of the target surface modification by reactive ion implantation during magnetron sputtering |
2004 |
Journal of vacuum science and technology: A: vacuum surfaces and films |
22 |
13 |
UA library record; WoS full record; WoS citing articles |
|
Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. |
Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions |
1998 |
Analytical chemistry |
70 |
12 |
UA library record; WoS full record; WoS citing articles |
|
Gijbels, R.; van Straaten, M.; Bogaerts, A. |
Mass spectrometric analysis of inorganic solids: GDMS and other methods |
1995 |
Advances in mass spectrometry |
13 |
12 |
UA library record; WoS full record; WoS citing articles |
|
Bogaerts, A.; Gijbels, R. |
Mathematical description of a direct current glow discharge in argon |
1996 |
Fresenius' journal of analytical chemistry |
355 |
12 |
UA library record; WoS full record; WoS citing articles |
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
On the effect of centrifugal stretching on the rotational partition function of an asymmetric top |
1991 |
The journal of chemical physics |
95 |
12 |
UA library record; WoS full record; WoS citing articles |