Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C. M.; Nellist, P. D.; Van Aert, S. |
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images |
2018 |
Physical review letters |
121 |
6 |
UA library record; WoS full record; WoS citing articles |
Shi, W.; Callewaert, V.; Barbiellini, B.; Saniz, R.; Butterling, M.; Egger, W.; Dickmann, M.; Hugenschmidt, C.; Shakeri, B.; Meulenberg, R. W.; Brück, E.; Partoens, B.; Bansil, A.; Eijt, S.W. H. |
Nature of the Positron State in CdSe Quantum Dots |
2018 |
Physical review letters |
121 |
6 |
UA library record; WoS full record; WoS citing articles |
Schweigert, I.V.; Schweigert, V.A.; Peeters, F.M. |
Reply to Rinn and Maass |
2001 |
Physical review letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
Valkering, A.M.C.; Sommerfeld, P.K.H.; van de Ven, R.A.M.; van der Heijden, R.W.; Blom, F.A.P.; Lea, M.J.; Peeters, F.M. |
Hall magnetocapitance in two-dimensional electron systems |
1998 |
Physical review letters |
81 |
4 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |
Tan, H.; Turner, S.; Yucelen, E.; Verbeeck, J.; Van Tendeloo, G. |
2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy : reply |
2012 |
Physical review letters |
108 |
|
UA library record; WoS full record |
Berdiyorov, G.R.; Milošević, M.V.; Peeters, F.M. |
Novel commensurability effects in superconducting films with antidot arrays |
2006 |
Physical review letters |
96 |
|
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. |
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy |
2020 |
Physical Review Letters |
124 |
|
UA library record; WoS full record; WoS citing articles |
Li, C.; Sanli, E.S.; Barragan-Yani, D.; Stange, H.; Heinemann, M.-D.; Greiner, D.; Sigle, W.; Mainz, R.; Albe, K.; Abou-Ras, D.; van Aken, P. A. |
Secondary-Phase-Assisted Grain Boundary Migration in CuInSe2 |
2020 |
Physical Review Letters |
124 |
|
UA library record; WoS full record; WoS citing articles |