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Microanalysis of individual silver halide microcrystals”. Wu S, van Daele A, Jacob W, Gijbels R, Verbeeck A, de Keyzer R, Scanning microscopy 7, 17 (1993)
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Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases”. Fanidis C, van Dyck D, van Landuyt J, Ultramicroscopy 48, 133 (1993)
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Infrared spectra of type laB diamonds”. Woods GS, Kiflawi I, Luyten W, Van Tendeloo G, Philosophical magazine letters 67, 405 (1993). http://doi.org/10.1080/09500839308240950
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Investigation by electron diffraction microscopy of (RE)BaCuOS polycrystalline ceramic compounds: interpretation of unexpected superstructures and influence of secondary phases”. Cloots R, Rulmont A, Krekels T, Van Tendeloo G, Diko P, Ausloos M, Journal of crystal growth 129, 394 (1993)
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A 2a2b3c superstructure in hexagonal NiS1-x: a study by means of electron diffraction and HREM”. Lioutas CB, Manolikas C, Van Tendeloo G, van Landuyt J, Journal of crystal growth 126, 457 (1993)
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A 2a2a3c superstructure in hexagonal Ni1-xS : a study by means of electron-diffraction and HRTEM”. Lioutas CB, Manolikas C, Van Tendeloo G, van Landuyt J, Journal of crystal growth 126, 457 (1993). http://doi.org/10.1016/0022-0248(93)90051-W
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High-field magneto-resistance in GaAs-GaAlAs heterojunctions”. Leadley DR, Nicholas RJ, Xu W, Peeters FM, Devreese JT, Foxon CT, Harris JJ, Physica: B : condensed matter 184, 197 (1993). http://doi.org/10.1016/0921-4526(93)90348-A
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High field transport in high carrier density GaAs/Ga0.8In0.2As/Ga0.75Al0.25As heterostructures”. van der Burgt M, van Esch A, Peeters FM, van Hove M, Borghs G, Herlach F, Physica: B : condensed matter 184, 211 (1993). http://doi.org/10.1016/0921-4526(93)90351-6
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Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy”. Luyten W, Volkov VV, van Landuyt J, Amelinckx S, Férauge C, Gijbels R, Vasilev MG, Shelyakin AA, Lazarev VB, Physica status solidi: A: applied research 140, 453 (1993). http://doi.org/10.1002/pssa.2211400216
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Interface optical phonon mode coupling in GaAs/AlAs quantum wells at high magnetic fields”. Hai GQ, Peeters FM, Devreese JT, Physica: B : condensed matter 184, 289 (1993). http://doi.org/10.1016/0921-4526(93)90367-F
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Magneto-optics of shallow impurities in superlattices”. Peeters FM, Shi JM, Devreese JT Kluwer, Dordrecht, page 221 (1993).
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Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride”. Weill, Chevalier, Chambon, Tressaud, Darriet, Etourneau, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
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Electron microscopy investigation of superconducting La2Cu(O,F)4+y oxyfluoride”. Weill F, Chevalier B, Chambon M, Tressaud A, Darriet B, Etourneau J, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
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Structural studies on superconducting materials and fullerites by electron microscopy”. Van Tendeloo G, Amelinckx S, Advanced materials 5, 620 (1993). http://doi.org/10.1002/adma.19930050904
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Electron microscopy and X-ray study of the growth of FeCr2S4 spinel single crystals by chemical vapour transport”. Volkov VV, van Heurck C, van Landuyt J, Amelinckx S, Zhukov EG, Polulyak ES, Novotortsev VM, Crystal research and technology 28, 1051 (1993). http://doi.org/10.1002/crat.2170280804
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Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite”. Schryvers D, van Landuyt JT, Proceedings Of The International Conference On Martensitic Transformations (icomat-92) , 263 (1993)
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Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
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On the phase-like nature of the 7M structure in Ni-Al”. Schryvers D, Tanner LE, MRS Japan: shape memory materials 18, 849 (1993)
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Radiation defects and ordered radiation patterns in Ni and Ni4Mo: a study by electron microscopy”. De Meulenaere P, Van Tendeloo G, van Landuyt J, Mommaert C, Severne G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 67, 745 (1993). http://doi.org/10.1080/01418619308207187
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Structural effects of element substitution on superconducting properties in 1-2-3 YBCO: an electron microscopy study”. Van Tendeloo G, Krekels T, Milat O, Amelinckx S, Journal of alloys and compounds 195, 307 (1993). http://doi.org/10.1016/0925-8388(93)90746-A
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EM study of twinning in the Ni5Al3 bainitic phase”. Schryvers D, Ma Y, Toth L, Tanner LE, Twinning in advanced materials , 395 (1993)
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Fundamental aspects of an analytical glow discharge”. van Straaten M, Gijbels R Royal Society of Chemistry, Cambridge, page 130 (1993).
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On the quasi-random entropy of linear species”. Slanina Z, Martin JML, François JP, Gijbels R, Theochem: applications of theoretical chemistry to organic, inorganic and biological problems 99, 83 (1993)
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Polaron cyclotron resonance spectrum with interface optical phonon modes in GaAs/AlAs quantum wells”. Hai GQ, Peeters FM, Devreese JT Kluwer, Dordrecht, page 243 (1993).
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The study of partially ordered 11/20 alloys by HREM”. De Meulenaere P, Van Tendeloo G, van Landuyt J, Microscopy research and technique 25, 169 (1993). http://doi.org/10.1002/jemt.1070250208
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Application of neural networks in image analysis: the classification of geometrical shapes”. Geuens I, Nys B, Gijbels R, Jacob W, CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology 10, 61 (1993)
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The chemical characterization of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 251 (1993)
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Development of a Fourier transform laser microprobe mass spectrometer with external ion source”. Gijbels R, ICR/Ion trap newsletter 30 (1993)
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Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM”. Muto S, Schryvers D, MRS Japan: shape memory materials 18, 853 (1993)
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Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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