Number of records found: 8872
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TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765
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TEM characterization of structural defects”. Van Tendeloo G Plenum Press, New York, page 473 (1996).
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TEM studies of processed Si device materials”. Vanhellemont J, Bender H, van Landuyt J, Conference series of the Institute of Physics 157, 393 (1997)
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A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals”. van Renterghem W, Schryvers D, van Landuyt J, Bollen D, van Roost C, de Keyzer R, The journal of imaging science and technology 45, 83 (2001)
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TEM study of YBa2Cu3O7-x thin films with Zn and Fe”. Verbist K, Van Tendeloo G, Ye M, Mehbod M, Deltour R, Physica: C : superconductivity 235, 663 (1994). http://doi.org/10.1016/0921-4534(94)91555-5
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Temperature and magnetic field dependence of the voltagein GaAs films with superconducting Ga grains”. Willems BL, Taylor DMJ, Fritzsche J, Malfait M, Vanacken J, Moshchalkov VV, Montoya E, Van Tendeloo G, European physical journal : B : condensed matter and complex systems 66, 25 (2008). http://doi.org/10.1140/epjb/e2008-00386-3
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Terahertz absorption window in bilayer graphene”. Dong HM, Qin H, Zhang J, Peeters FM, Xu W Ieee, New York, N.Y., page 247 (2009).
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Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix”. Schryvers D, Tirry W, Yang Z, , 205 (2005)
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The application of laser beam diffraction and scattering methods in the measurement of shape and determination of material parameters”. Sreckovic MZ, Tomic E, Ostojic SM, Ilic JT, Bundaleski N, Sekulic RS, Mlinar V, Lasers in Engineering (Old City Publishing) 17, 179 (2007)
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The evolution of HVEM application in antwerp”. van Landuyt J, Ultramicroscopy T2 –, 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan 39, 287 (1991). http://doi.org/10.1016/0304-3991(91)90208-N
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The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS)”. Lenaerts J, Verlinden G, Gijbels R, Geuens I, Callant P, , 180 (2000)
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The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals”. Van Renterghem W, Karthauser S, Schryvers D, van Landuyt J, De Keyzer R, Van Roost C, , 167 (2000)
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The isotope effect in hydrogen-bonded systems”. Bussmann-Holder A, Michel KH, International journal of modern physics: B: condensed matter physics, statistical physics, applied physics T2 –, 1st International Conference on New Theories, Discoveries, and, Applications of Superconductors and Related Materials (New3SC-1), FEB 19-24, 19 12, 3406 (1998). http://doi.org/10.1142/S021797929800274X
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Theoretical model for the structural phase transition and the metal-insulator transition in polymerized KC60”. Verberck B, Nikolaev AV, Michel KH, Fullerenes, nanotubes, and carbon nanostructures T2 –, 6th Biennial International Workshop on Fullerenes and Atomic Clusters, JUN 30-JUL 04, 2003, St Petersburg, RUSSIA 12, 243 (2004). http://doi.org/10.1081/FST-120027164
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Theoretical study of InAs/GaAs quantum dots grown on [11k] substrates in the presence of a magnetic field”. Mlinar V, Peeters FM, Microelectronics journal 37, 1427 (2006). http://doi.org/10.1016/j.mejo.2006.05.018
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Theory of crystal structures of polymerized C60-fullerite and fullerides AC60, A=K, Rb, Cs”. Michel KH, Nikolaev AV, Verberck B s.l. (2001).
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Thermal stability of atomic layer deposited Zr:Al mixed oxide thin films: an in situ transmission electron microscopy study”. Nistor LC, Richard O, Zhao C, Bender H, Van Tendeloo G, Journal of materials research 20, 1741 (2005). http://doi.org/10.1557/JMR.2005.0217
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Thermodynamic consistency and integral equations for the liquid structure”. Leys FE, March NH, Lamoen D, Journal Of Chemical Physics 117, 10726 (2002). http://doi.org/10.1063/1.1522377
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Towards quantitative EDX results in 3 dimensions”. Goris B, Freitag B, Zanaga D, Bladt E, Altantzis T, Ringnalda J, Bals S, Microscopy and microanalysis 20, 766 (2014). http://doi.org/10.1017/S1431927614005558
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Towards quantitative high resolution electron microscopy?”.Van Tendeloo G, op de Beeck M, De Meulenaere P, van Dyck D, Institute of physics conference series 147, 67 (1995)
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M, Springer proceedings in physics 107, 389 (2005)
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Trial solution and critical frequency to the singly quantized vortex in big Bose-Einstein condensates”. Xu Y, Jia DJ, Chen ZY, Modern physics letters B 20, 995 (2006). http://doi.org/10.1142/S0217984906011104
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Tubular fullerenes in carbon nanotubes”. Tarakina NV, Verberck B, Fullerenes, nanotubes, and carbon nanostructures 20, 538 (2012). http://doi.org/10.1080/1536383X.2012.656058
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Tuning of energy levels in a superlattice”. Peeters FM, Materials Research Society symposium proceedings 325, 471 (1994)
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Tuning of the optical properties of (11k) grown InAs quantum dots by the capping layer”. Mlinar V, Peeters FM, Microelectronics journal 39, 359 (2008). http://doi.org/10.1016/j.mejo.2007.07.052
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Tuning the superconducting properties of nanomaterials”. Croitoru MD, Shanenko AA, Peeters FM Springer, Dordrecht, page 1 (2009).
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Tunneling through a combined magnetic-potential barrier”. Papp G, Peeters FM, Physica status solidi: B: basic research 225, 433 (2001)
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Two kinds of vortex states in thin mesoscopic superconductors”. Baelus BJ, Kanda A, Peeters FM, Ootuka Y, Kadowaki K, Journal of physics : conference series T2 –, Journal of physics: conference series 43, 647 (2006). http://doi.org/10.1088/1742-6596/43/1/158
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Type of phase transitions in a mesoscopic superconducting disc”. Deo PS, Schweigert VA, Peeters FM, Geim AK, Physica: E 1, 297 (1997). http://doi.org/10.1016/S1386-9477(97)00063-5
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Ultra-high resolution electron tomography for materials science : a roadmap”. Batenburg KJ, Bals S, Van Aert S, Roelandts T, Sijbers J, Microscopy and microanalysis 17, 934 (2011). http://doi.org/10.1017/S143192761100554X
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