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Chemische en morfologische karakterisatie van de grissailles van Capronnier met behulp van EPXMA”. Schalm O, Janssens K, Caen J, Adams F, (1999)
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens KH, Adams FC, van Langevelde F, Vis RD, Jones KW, Rivers M, Sutton S, Advances in X-ray analysis 35, 1265 (1992)
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992)
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Composition of 15-17th century archaeological glass vessels excavated in Antwerp, Belgium”. Janssens K, de Raedt I, Vincze L, Vekemans B, Adams F, Haller M, Knöchel A, HASYLAB Jahresbericht 1997 1, 937 (1998)
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Composition of facon-de-venise and Venetian glass from Antwerp and the Southern Netherlands”. de Raedt I, Janssens K, Veeckman J, Adams F page 346 (2000).
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The elemental composition of airborne particulate matter in the Atacama desert, Chile”. Rojas CM, Figueroa L, Janssens KH, Van Espen PE, Adams FC, Van Grieken RE, The science of the total environment 91, 251 (1990). http://doi.org/10.1016/0048-9697(90)90302-B
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Evaluation of a Monte Carlo simulation for EDXRF spectrometers at beamline BW5, HASYLAB”. Vincze L, Vekemans B, Janssens K, Adams F, Lippmann T, HASYLAB Jahresbericht 1997 1, 1043 (1998)
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Evaluation of polycapillary lenses as focussing elements in sub-mm XRF analysis of artistic objects”. Vekemans B, Janssens K, Adams F, Andong L, He Y, Yiming Y page 278 (1998).
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Fluorescent tomography of metals in fly-ash particles at beamline L”. Vincze L, Vekemans B, Janssens K, Adams F, Haller M, HASYLAB Jahresbericht 1997 1, 959 (1998)
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Fluorescent tomography of phantom samples at the beamline L”. Vekemans B, Vincze L, Vittiglio G, Janssens K, Adams F, HASYLAB Jahresbericht (1999)
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Future of m-XRF”. Adams F, Janssens K page 370 (2000).
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A general Monte-Carlo simulation of energy-dispersive X-ray fluorescence spectrometers : 1 : unpolarized radiation, homogenious samples”. Vincze L, Janssens K, Adams F, Spectrochimica acta: part B : atomic spectroscopy 48, 553 (1993). http://doi.org/10.1016/0584-8547(93)80060-8
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Glass trade in Antwerp during the 15th through 17th century”. de Raedt I, Janssens K, Veeckman J, Adriaens A, Adams F page 38 (2000).
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High energy X-ray microscopy for characterisation of fuel particles”. Salbu B, Krekling T, Lind OC, Oughton DH, Drakopoulos M, Simionovici AS, Snigireva I, Snigirev A, Weitkamp T, Adams F, Janssens K, Kashparov VA, Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment 467, 1249 (2001). http://doi.org/10.1016/S0168-9002(01)00641-6
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High-resolution X-ray fluorescence microtomography of homogeneous samples”. Simionovici AS, Chukalina M, Schroer C, Drakopoulos M, Snigirev A, Snigireva I, Lengeler B, Janssens K, Adams F, IEEE transactions on nuclear science 47, 2736 (2000). http://doi.org/10.1109/23.901180
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ID18F: a new X-ray microprobe end station”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, ESRF highlights 2001 , 96 (2002)
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Interpretation and use of inter-element correlation graphs obtained by scanning X-ray fluorescence micro-beam spectrometry from individual particles: part 1: theory”. Somogyi A, Janssens K, Vincze L, Vekemans B, Rindby A, Adams F, Spectrochimica acta: part B : atomic spectroscopy 55, 75 (2000). http://doi.org/10.1016/S0584-8547(99)00172-X
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Interpretation and use of inter-element correlation graphs obtained by scanning X-ray fluorescence micro-beam spectrometry from individual particles: part 2: application”. Somogyi A, Janssens K, Vincze L, Vekemans B, Rindby A, Adams F, Spectrochimica acta: part B : atomic spectroscopy 55, 1039 (2000). http://doi.org/10.1016/S0584-8547(00)00220-2
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Interpretation of cappilary generated spatial and angular distribution of X-rays: theoretical modeling and experimental verification using the European Synchrotron Radiation Facility Optical Beamline”. Vincze L, Janssens K, Adams F, Engström P, Rindby A, The review of scientific instruments 69, 3494 (1998). http://doi.org/10.1063/1.1149127
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A laboratory mu-XRF spectrometer employing capillary optics”. Janssens K, Vekemans B, Rindby A, Vincze L, Adams F, , 159 (1995)
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Localised and non-destructive analysis of metallic artefacts from ancient Egypt by means of a compact μ-XRF instrument”. Vittiglio G, Janssens K, Adams F, Oost A, Spectrochimica acta: part B : atomic spectroscopy 54, 1697 (1999). http://doi.org/10.1016/S0584-8547(99)00100-7
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Micro and surface analysis in archaeology”. Adams F, Adriaens A, Aerts A, de Raedt I, Janssens K, Schalm O, Journal of analytical atomic spectrometry 12, 257 (1997). http://doi.org/10.1039/A606091I
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Kempenaers L, Vincze L, Vekemans B, Janssens K, Adams F, Somogyi A, Drakopoulos M, Simionovici AS (2004) Micro-heterogeneity study of trace elements in reference materials. 132 p
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A micro XRF spectrometer based on rotating anode generator and capillary optics”. Janssens K, Vekemans B, Vincze L, Adams F, Rindby A, Spectrochimica acta: part B : atomic spectroscopy 51, 1661 (1996)
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Microscopic synchroton radiation induced X-ray fluorescence analysis”. Janssens K, Vincze L, Aerts A, Vekemans B, Adams F, Jones K, Knöchel A, Mikrochimica acta: supplementum , 87 (1996)
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Janssens KHA, Adams FCV, Rindby A (2000) Microscopic X-ray fluorescence analysis. 419 p
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Microscopic X-ray fluorescence analysis”. Janssens K, Vincze L, Rubio J, Bernasconi G, Adams F, Journal of analytical atomic spectrometry 9, 151 (1994). http://doi.org/10.1039/JA9940900151
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Microscopic X-ray fluorescence analysis at second and third generation synchrotron sources”. Janssens K, Adams F, Debye Institute synchrotron chronicle , 9 (1997)
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Microscopical X-ray fluorescence analysis and related methods with laboratory and synchrotron radiation sources”. Adams F, Janssens K, Snigirev A, Journal of analytical atomic spectrometry 13, 319 (1998). http://doi.org/10.1039/A707100K
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Modeling of photon scattering at high X-ray energies : experiment versus simulation”. Vincze L, Vekemans B, Janssens K, Adams F, Journal of analytical atomic spectrometry T2 –, 15th International Congress on X-Ray Optics and Microanalysis (ICXOM), AUG 24-27, 1998, ANTWERP, BELGIUM 14, 529 (1999). http://doi.org/10.1039/A808040B
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