| Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors |
2020 |
Scientific Reports |
10 |
18 |
UA library record; WoS full record; WoS citing articles |
