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Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. | ||||
Title | High resolution electron microscopy from imaging towards measuring | Type | H2 Book chapter | ||
Year | 2001 | Publication | ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 | Abbreviated Journal | |
Volume | Issue | Pages | 2081-2086 | ||
Keywords | H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Ieee | Place of Publication | Editor | ||
Language | Wos | Publication Date | 2002-11-13 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | 0-7803-6646-8 | Additional Links | UA library record | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:136870 | Serial | 4501 | ||
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