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Author | Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. | ||||
Title | Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) | Type | P1 Proceeding | ||
Year | 1997 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | |||
Keywords | P1 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | s.l. | Editor | ||
Language | Wos | A1997BJ88J00018 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record; WoS full record; | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:20475 | Serial | 3392 | ||
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