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Author | Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. | ||||
Title | Towards quantitative high resolution electron microscopy? | Type | A1 Journal article | ||
Year | 1995 | Publication | Institute of physics conference series | Abbreviated Journal | |
Volume | 147 | Issue | Pages | 67-72 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The basics of the interpretation of high resolution images showing detail of the order of 0.1 nm are shortly explained here. The use of a field emission source, a CCD camera and an adapted reconstruction method for restoring the projected crystal potential (focus variation method) allows a quantitative interpretation of HREM images. Examples of partially disordered alloys and carbonate ordering in high Tc superconductors are presented. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | London | Editor | ||
Language | Wos | A1995BE67F00014 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0-7503-0357-3; 0951-3248; 0305-2346 | ISBN | Additional Links | UA library record; WoS full record; | |
Impact Factor | Times cited ![]() |
Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:13015 | Serial | 3688 | ||
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