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“Microscopic X-ray fluorescence analysis at second and third generation synchrotron sources”. Janssens K, Adams F, Debye Institute synchrotron chronicle , 9 (1997)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“The use of scanning X-ray microprobe for simultaneous XRF/XRD studies of fly-ash particles”. Rindby A, Engström P, Janssens K, Journal of synchotron radiation 4, 228 (1997)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“The effect of sintering and Pd-doping on the conversion of CO to CO2 on SnO2 gas sensor materials”. Delabie L, Honoré, M, Lenaerts S, Huyberechts G, Roggen J, Maes G, Sensors And Actuators B-Chemical 44, 446 (1997). http://doi.org/10.1016/S0925-4005(97)00170-6
Abstract: The principal aim of this work is to study the effect of the processes of sintering and Pd doping of SnO2 gas sensor materials on the conversion of CO to CO2. For this purpose, the gas phase above screen printed sensor material is investigated using FTIR spectroscopy, while surface area, porosity and particle size measurements are performed on the SnO2 powders. During sintering, larger agglomerates of primary particles are formed, which results in a larger conversion degree of CO. The effect of Pd doping of the tin dioxide film on the CO conversion is more pronounced. The transformation of CO starts at a lower temperature and the conversion degree increases remarkably.
Keywords: A1 Journal article
Impact Factor: 5.401
DOI: 10.1016/S0925-4005(97)00170-6
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“The cathedral of Bari, Italy: evaluation of environmental effects on stone decay phenomena”. Torfs K, Van Grieken R, Zezza F, Garcia N, Macri F, Studies in conservation = Études de conservation 42, 193 (1997). http://doi.org/10.2307/1506750
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.2307/1506750
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“Chemical composition of sediments and suspended matter from the Cauvery and Brahmaputra rivers (India)”. Dekov VM, Araujo F, Van Grieken R, Subramanian V, The science of the total environment 203, 51 (1997)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Chemical composition of sediments, suspended matter, river and ground water of the Nile (Aswan-Sohag transvers)”. Dekov VM, Komy Z, Araujo F, van Put A, Van Grieken R, The science of the total environment 201, 195 (1997). http://doi.org/10.1016/S0048-9697(97)84057-0
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0048-9697(97)84057-0
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“Chemical relations between atmospheric aerosols, deposition and stone decay layers on historic buildings at the Mediterranean coast”. Torfs K, Van Grieken R, Atmospheric environment : an international journal 31, 2179 (1997)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Direct current glow discharge mass spectrometry for elemental characterization of polymers”. Schelles W, Van Grieken R, Analytical chemistry 69, 2931 (1997). http://doi.org/10.1021/AC970186T
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC970186T
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“Energy-dispersive X-ray fluorescence in geochemical mapping”. Civici N, Van Grieken R, X-ray spectrometry 26, 147 (1997). http://doi.org/10.1002/(SICI)1097-4539(199707)26:4<147::AID-XRS193>3.0.CO;2-X
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/(SICI)1097-4539(199707)26:4<147::AID-XRS193>3.0.CO;2-X
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“Environmental problems”. Jambers W, Van Grieken RE page 803 (1997).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Individual particle analysis of Western Mediterranean sediment cores, Rhône suspended matter and Sahara aerosols: investigation of inputs to the sediments”. Wegrzynek D, Jambers W, Van Grieken R, Eisma D, Marine chemistry 57, 25 (1997)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Optimization of sample preparation for grazing emission X-ray fluorescence in micro- and trace analysis applications”. Claes M, de Bokx P, Willard N, Veny P, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 52, 1063 (1997). http://doi.org/10.1016/S0584-8547(96)01654-0
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0584-8547(96)01654-0
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“Performance and characteristics of two total-reflection X-ray fluorescence and a particle induced X-ray emission setup for aerosol analysis”. Injuk J, Van Grieken R, Klockenkämper R, von Bohlen A, Kump P, Spectrochimica acta: part B : atomic spectroscopy 52, 977 (1997). http://doi.org/10.1016/S0584-8547(97)00028-1
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0584-8547(97)00028-1
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“Quantitative analysis of zirconium oxide by direct glow discharge mass spectrometry using a secondary cathode”. Schelles W, Van Grieken R, Journal of analytical atomic spectrometry 12, 49 (1997)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Single particle characterisation of inorganic suspension in Lake Baikal”. Jambers W, Van Grieken R, Environmental science and technology 31, 1525 (1997)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Use of stable isotope measurements to evaluate the origin of suphur in gypsum layers on limestone buildings”. Torfs KM, Van Grieken RE, Buzek F, Environmental science and technology 31, 2650 (1997)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Weathering mechanism of Pentelic marble under ambient atmospheric conditions derived from runoff studies”. Delalieux F, Sweevers H, Van Grieken R, (1997)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy”. Blank DHA, Rijnders AJHM, Verhoeven MAJ, Bergs RMH, Rogalla H, Verbist K, Lebedev O, Van Tendeloo G, Journal of alloys and compounds
T2 –, Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France 251, 206 (1997). http://doi.org/10.1016/S0925-8388(96)02799-5
Abstract: We studied the morphology of ramps in REBa2CU3O7 (REBCO) epitaxial films on SrTiO3 substrates, fabricated by RF magnetron sputter deposition and pulsed laser deposition (PLD), by scanning probe microscopy (SPM) and high resolution electron microscopy (HREM). The ramps were fabricated by Ar ion beam etching using masks of standard photoresist and TIN. AFM-studies on ramps in sputter deposited films show a strong dependence, i.e. formation of facets and ridges, on the angle of incidence of the ion beam with respect to the substrate surface as well as the rotation angle with respect to the crystal axes of the substrate. Ramps in pulsed laser deposited films did not show this dependence, Furthermore, we studied the effect of an anneal step prior to the deposition of barrier layers (i.e. PrBa2CU3O7, SrTiO3, CeO2) on the ramp. First results show a recrystallization of the ramp surface, resulting in terraces and a non-homogeneous growth of the barrier material on top of it. The thickness variations, for thin layers of barrier material, con even become much larger than expected from the amount of deposited material and are dependent on the deposition and anneal conditions. HREM studies show a well defined interface between barrier layer and electrodes. The angle of the ramp depends on the etch rate of the mask and REBCO, and on the angle of incidence of the ion beam. TiN has a much lower etch rate compared to photoresist, resulting in an angle of the ramp comparable to the angle of incidence, resulting in a low etching rate on the ramp. These results will lead to improved electrical characteristics of ramp-type junctions.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 3.133
DOI: 10.1016/S0925-8388(96)02799-5
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“Microstructure of α-axis oriented YBCO films on SrTiO3 substrates using a new template layer La4BaCu5O13”. Prouteau C, Verbist K, Hamet JF, Mercey B, Hervieu M, Raveau B, Van Tendeloo G, Physica: C : superconductivity 288, 231 (1997)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
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“Multiple orientational order parameters in solid C60”. Copley JRD, Michel KH, Physica: B : condensed matter
T2 –, International Conference on Neutron Scattering, AUG 17-21, 1997, TORONTO, CANADA 241, 454 (1997). http://doi.org/10.1016/S0921-4526(97)00617-0
Abstract: The transition Fm (3) over bar m -->Pa (3) over bar in solid C-60 is driven by the condensation of orientational modes belonging to X-5(+) irreducible representations (irreps) of Fm (3) over bar m. Taking into account irreps up to the manifold l = 12, we have studied the primary and secondary orientational order parameters loops). We have numerically solved the coupled molecular field equations for these oops and calculated the temperature dependence of Bragg reflection intensities. (C) 1998 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 1.386
DOI: 10.1016/S0921-4526(97)00617-0
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“New intermediate defect configuration in Si studied by in situ HREM irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Conference series of the Institute of Physics 157, 43 (1997)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Room temperature (2a x 2b) superstructure formed in Sr-submitted Bi2(Sr1.6Y0.4)CaCu2Oy single crystals”. Zhang XF, Van Tendeloo G, Hu DW, Brabers VAM, Physica: C : superconductivity 278, 31 (1997)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
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“Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
Keywords: H3 Book chapter; Condensed Matter Theory (CMT)
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“Short-range order in phase segregation systems”. De Meulenaere P, Mommaert C, Van Tendeloo G, Solid state communications 102, 687 (1997). http://doi.org/10.1016/S0038-1098(97)00071-9
Abstract: Spin systems on an f.c.c.-lattice which exhibit phase segregation are studied by means of Monte Carlo simulations. Short-range order, both above and below the segregation temperature, is observed. Experimental evidence for short range order in Ti-V is provided by electron diffraction.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.554
DOI: 10.1016/S0038-1098(97)00071-9
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“Structural properties of c-axis oriented epitaxial YBa2Cu3O7-\delta thin films”. Ye M, Schroeder J, Deltour R, Delplancke MP, Winand R, Verbist K, Van Tendeloo G, Superlattices and microstructures 21, 287 (1997)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.123
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“Structural studies of nanocrystalline diamond thin films”. Nistor LC, van Landuyt J, Ralchenko VG, Obratzova ED, Korothushenko KG, Smolin AA, Materials science forum 239-241, 115 (1997)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Study of ramp-type Josephson junctions by HREM”. Verbist K, Lebedev OI, Van Tendeloo G, Verhoeven MAJ, Rijnders AJHM, Blank DHA, Electronic Applications, Vol 2: Large Scale And Power Applications , 49 (1997)
Abstract: Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-delta high-T-c superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-delta. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Brox O, Benninghoven A, Geuens I, de Keyzer R, (1997)
Keywords: P1 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“TEM studies of processed Si device materials”. Vanhellemont J, Bender H, van Landuyt J, Conference series of the Institute of Physics 157, 393 (1997)
Abstract: Recent developments in the field of TEM characterisation of Si device materials are discussed and illustrated by a few case studies of material in different stages of various kinds of processing. Important challenges are the ever decreasing defect densities and device feature sizes. Defect delineation techniques using large area inspection tools yielding accurate coordinates of the defects to be studied have therefore become an essential part of the TEM analysis procedure. The possibility to transfer these defect coordinates without loss of accuracy to tools for local TEM specimen preparation is also a conditio sine qua non for a successful analysis. Insitu TEM remains important as dynamic processes can be observed and analysed under well defined experimental conditions. As case studies illustrating new developments, results are presented on defects in as-grown Ct silicon, on in-situ studies in processed silicon, on problem sites in advanced integrated circuit structures and on assessment of localised strain fields in the nm size scale.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Type of phase transitions in a mesoscopic superconducting disc”. Deo PS, Schweigert VA, Peeters FM, Geim AK, Physica: E 1, 297 (1997). http://doi.org/10.1016/S1386-9477(97)00063-5
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 2.221
DOI: 10.1016/S1386-9477(97)00063-5
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