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A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source”. van Vaeck L, van Espen P, Gijbels R, Baykut G, Laukien FH, European mass spectrometry 6, 277 (2000). http://doi.org/10.1255/ejms.342
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Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometry”. Lenaerts J, van Vaeck L, Gijbels R, Rapid communications in mass spectrometry 17, 2115 (2003). http://doi.org/10.1002/rcm.1160
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Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry”. Struyf H, van Vaeck L, Kennis P, Gijbels R, van Grieken R, Rapid communications in mass spectrometry 10, 699 (1996). http://doi.org/10.1002/(SICI)1097-0231(199604)10:6<699::AID-RCM521>3.0.CO;2-8
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Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis”. Struyf H, van Roy W, van Vaeck L, van Grieken R, Gijbels R, Caravatti P, Analytica chimica acta 283, 139 (1993). http://doi.org/10.1016/0003-2670(93)85216-7
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Molecular information in static SIMS for the speciation of inorganic compounds”. van Ham R, Adriaens A, van Vaeck L, Gijbels R, Adams F, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 161/163, 245 (2000). http://doi.org/10.1016/S0168-583X(99)00750-8
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Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry”. Poels K, van Vaeck L, Gijbels R, Analytical chemistry 70, 504 (1998). http://doi.org/10.1021/ac9709108
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Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation”. van Vaeck L, Adriaens A, Gijbels R, Mass spectrometry reviews 18, 1 (1999)
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