|   | 
Details
   web
Records
Author Ke, X.; Bittencourt, C.; Van Tendeloo, G.
Title Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials Type A1 Journal article
Year 2015 Publication Beilstein journal of nanotechnology Abbreviated Journal Beilstein J Nanotech
Volume 6 Issue 6 Pages 1541-1557
Keywords A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Abstract A major revolution for electron microscopy in the past decade is the introduction of aberration correction, which enables one to increase both the spatial resolution and the energy resolution to the optical limit. Aberration correction has contributed significantly to the imaging at low operating voltages. This is crucial for carbon-based nanomaterials which are sensitive to electron irradiation. The research of carbon nanomaterials and nanohybrids, in particular the fundamental understanding of defects and interfaces, can now be carried out in unprecedented detail by aberration-corrected transmission electron microscopy (AC-TEM). This review discusses new possibilities and limits of AC-TEM at low voltage, including the structural imaging at atomic resolution, in three dimensions and spectroscopic investigation of chemistry and bonding. In situ TEM of carbon-based nanomaterials is discussed and illustrated through recent reports with particular emphasis on the underlying physics of interactions between electrons and carbon atoms.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000357977300001 Publication Date 2015-07-16
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 2190-4286; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.127 Times cited (down) 10 Open Access
Notes 246791 Countatoms Approved Most recent IF: 3.127; 2015 IF: 2.670
Call Number c:irua:126857 Serial 2682
Permanent link to this record
 

 
Author Struzzi, C.; Erbahar, D.; Scardamaglia, M.; Amati, M.; Gregoratti, L.; Lagos; Van Tendeloo, G.; Snyders, R.; Ewels, C.; Bittencourt, C.
Title Selective decoration of isolated carbon nanotubes by potassium evaporation : scanning photoemission microscopy and density functional theory Type A1 Journal article
Year 2015 Publication Journal of materials chemistry C : materials for optical and electronic devices Abbreviated Journal J Mater Chem C
Volume 3 Issue 3 Pages 2518-2527
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Site selective doping of aligned carbon nanostructures represents a promising approach for their implementation in actual devices. In the present work we report on alkali metals decoration on low density vertically aligned carbon nanotubes, disclosing the possibility of engineering site selective depositions of potassium atoms on the carbon systems. Photoemission measurements were combined with microscopy demonstrating the effective spatial control of alkali deposition. The changes of electronic structures of locally doped carbon regions were studied by exploiting the ability of the scanning photoemission microscopy technique. From the analysis of experimental data supported by theoretical calculations, we show the tuning of the charge transfer from potassium to carbon atoms belonging to neighboring nanotubes or along the same tube structure.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000350984200011 Publication Date 2014-12-30
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 2050-7526;2050-7534; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 5.256 Times cited (down) 6 Open Access
Notes Approved Most recent IF: 5.256; 2015 IF: 4.696
Call Number c:irua:125496 Serial 2963
Permanent link to this record
 

 
Author Bittencourt, C.; Ke, X.; Van Tendeloo, G.; Tagmatarchis, N.; Guttmann, P.
Title NEXAFS spectromicroscopy of suspended carbon nanohorns Type A1 Journal article
Year 2013 Publication Chemical physics letters Abbreviated Journal Chem Phys Lett
Volume 587 Issue Pages 85-87
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract We demonstrate that near-edge X-ray-absorption fine-structure spectroscopy combined with full-field transmission X-ray microscopy can be used to study the electronic structure of suspended carbon nanohorns. Based on reports of electronic structure calculations additional spectral features observed in the π region of the NEXAFS spectrum recorded on the carbon nanohorns were associated to the presence of the pentagonal rings and the folding of the graphene sheet.
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000326104500016 Publication Date 2013-09-18
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0009-2614; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.815 Times cited (down) 4 Open Access
Notes Fp7; Countatoms; Approved Most recent IF: 1.815; 2013 IF: 1.991
Call Number UA @ lucian @ c:irua:111592 Serial 2339
Permanent link to this record
 

 
Author Guttmann, P.; Bittencourt, C.; Ke, X.; Van Tendeloo, G.; Umek, P.; Arcon, D.; Ewels, C.P.; Rehbein, S.; Heim, S.; Schneider, G.
Title TXM-NEXAFS of TiO2-based nanostructures Type P1 Proceeding
Year 2011 Publication AIP conference proceedings Abbreviated Journal
Volume 1365 Issue Pages 437-440
Keywords P1 Proceeding; Electron microscopy for materials research (EMAT)
Abstract In this work, electronic properties of individual TiOx-pristine nanoribbons (NR) prepared by hydrothermal treatment of anatase TiO(2) micro-particles were studied using the HZB transmission x-ray microscope (TXM) at the BESSY II undulator beamline U41-FSGM. NEXAFS is ideally suited to study TiO(2)-based materials because both the O K-edge and Ti L-edge features are very sensitive to the local bonding environment, providing diagnostic information about the crystal structures and oxidation states of various forms of titanium oxides and sub-oxides. TXM-NEXAFS combines full-field x-ray microscopy with spectroscopy, allowing the study of the electronic structure of individual nanostructures with spatial resolution better than 25 nm and a spectral resolution of up to E/Delta E = 10000. The typical image field in TXM-NEXAFS measurements is about 10 mu m. 10 mu m, which is large compared to the individual nanoparticle. Therefore, one image stack already contains statistically significant data. In addition, the directional electric field vector ((E) over bar) of the x-rays can be used as a “search tool” for the direction of chemical bonds of the atom selected by its absorption edge.
Address
Corporate Author Thesis
Publisher Place of Publication New York Editor
Language Wos 000298672400103 Publication Date 2011-09-19
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited (down) 2 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:113071 Serial 3789
Permanent link to this record