| Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
| Austing, D.G.; Payette, C.; Yu, G.; Gupta, J.A.; Aers, G.C.; Nair, S.V.; Partoens, B.; Amaha, S.; Tarucha, S. |
Characterization and modeling of single-particle energy levels and resonant currents in a coherent quantum dot mixer |
2011 |
AIP conference proceedings
T2 – 30th International Conference on the Physics of Semiconductors (ICPS-30), JUL 25-30, 2010, Seoul, SOUTH KOREA |
|
|
UA library record; WoS full record |
| Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. |
Characterization of MO derived nanostructured titania powders |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Mortet, V.; Zhang, L.; Echert, M.; Soltani, A.; d' Haen, J.; Douheret, O.; Moreau, M.; Osswald, S.; Neyts, E.; Troadec, D.; Wagner, P.; Bogaerts, A.; Van Tendeloo, G.; Haenen, K. |
Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition |
2009 |
Materials Research Society symposium proceedings |
|
|
UA library record |
| van Landuyt, J.; Van Tendeloo, G. |
Charcaterization by high-resolution transmission electron microscopy |
1998 |
|
|
|
UA library record; WoS full record; |
| Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. |
Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy |
2001 |
Materials science in semiconductor processing |
4 |
|
UA library record; WoS full record |
| De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
|
|
|
UA library record; WoS full record; |
| Peeters, F.M.; Partoens, B.; Schweigert, V.A.; Schweigert, I.V. |
Classical atomic bilayers |
1998 |
|
|
|
UA library record; WoS full record; |
| Anisimovas, E.; Matulis, A.; Peeters, F.M. |
Classical nature of quantum dots in a magnetic field |
2005 |
Acta physica Polonica: A: general physics, solid state physics, applied physics |
107 |
|
UA library record; WoS full record; |
| de Backer, J.W.; Vos, W.G.; Germonpré, P.; Salgado, R.; Parizel, P.M.; de Backer, W. |
Clinical applications of image-based airway computational fluid dynamics: assessment of inhalation medication and endobronchial devices |
2009 |
Proceedings of the Society of Photo-optical Instrumentation Engineers |
7262 |
|
UA library record |
| Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation |
1999 |
Institute of physics conference series
T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND |
|
|
UA library record; WoS full record; |
| Janssens, K.; Bogaerts, A.; van Grieken, R. |
Colloquium Spectroscopicum Internationale 34, Antwerp, Belgium, 4-9 September 2005: preface |
2006 |
Talanta : the international journal of pure and applied analytical chemistry |
70 |
|
UA library record; WoS full record |
| Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Combined characterization of nanostructures by AEM and STM |
1996 |
Mikrochimica acta: supplementum |
13 |
|
UA library record; WoS full record; |
| Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al. |
Comparative study of structural properties and photoluminescence in InGaN layers with a high In content |
2000 |
Internet journal of nitride semiconductor research
T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS |
5 |
|
UA library record; WoS full record; |
| Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy |
1994 |
|
|
|
UA library record; WoS full record; |
| Yang, Z.; Schryvers, D. |
Composition gradients surrounding Ni4Ti3 precipitates in a NiTi alloy studied by EELS, EFTEM and EDX |
2006 |
International journal of applied electromagnetics and mechanics |
23 |
|
UA library record; WoS full record; |
| Saraiva, M.; Georgieva, V.; Mahieu, S.; van Aeken, K.; Bogaerts, A.; Depla, D. |
Compositional effects on the growth of Mg(M)O films |
2010 |
Journal of applied physics |
107 |
|
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
|
UA library record |
| Bleiner, D.; Bogaerts, A. |
Computer simulations of sample chambers for laser ablation-inductively coupled plasma spectrometry |
2007 |
Spectrochimica acta: part B : atomic spectroscopy |
62 |
|
UA library record; WoS full record; WoS citing articles |
| Connolly, M.R.; Bemding, S.J.; Milošević, M.V.; Clem, J.R.; Tamegai, T. |
Continuum versus discrete flux behaviour in large mesoscopic Bi2Sr2CaCu2O8+\delta disks |
2010 |
Physica: C : superconductivity |
470 |
|
UA library record; WoS full record |
| Kato, H.; Peeters, F.M. |
Correlation between a remote electron and a two-dimensional electron gas in resonant tunneling devices |
2001 |
|
|
|
UA library record; WoS full record; |
| Pentcheva, E.N.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Correlations géothermométriques des éléments-traces des hydrothermes de terrains granitiques (Bulgarie Méridionale) |
1992 |
Doklady na Balgarskata Akademija na Naukite |
44 |
|
UA library record; WoS full record; |
| Moshnyaga, V.; Damaschke, B.; Shapoval, O.; Belenchuk, A.; Faupel, J.; Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Mücksch, M.; Tsurkan, V.; Tidecks, R.; Samwer, K. |
Corrigendum: Structural phase transition at the percolation threshold in epitaxial (La0.7Ca0.3MnO3)1-x:(MgO)x nanocomposite films |
2005 |
Nature materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Gijbels, R.; Jacob, W.; van Daele, A. |
Cryo-electron spectroscopic imaging, electron energy-loss spectroscopy and energy-dispersive X-ray analysis of Ag(Br,I) nano- and microcrystals |
1998 |
Mikrochimica acta: supplementum |
15 |
|
UA library record; WoS full record; |
| Lebedev, O.I.; Van Tendeloo, G. |
Crystalline and amorphous frameworks with giant pores: what information ca we expect from advanced TEM? |
2008 |
Electron microscopy and multiscale modeling: proceedings of the AIP conference proceedings |
999 |
|
UA library record; WoS full record; WoS citing articles |
| van Landuyt, J.; Van Tendeloo, G.; Amelinckx, S.; Zhang, X.F.; Zhang, X.B.; Luyten, W. |
Crystallography of fullerites and related graphene textures |
1994 |
Materials science forum |
150/151 |
|
UA library record; WoS full record; |
| Schryvers, D.; Seo, J.W.; Richard, O.; Vermeulen, W.; Potapov, P. |
Decomposition phenomena in Ni-Mn-Ti austenite |
1999 |
|
|
|
UA library record; WoS full record; |
| Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H. |
Dedicated TEM on domain boundaries from phase transformations and crystal growth |
2013 |
Phase transitions |
86 |
|
UA library record; WoS full record; WoS citing articles |
| Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. |
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study |
2000 |
|
|
|
UA library record; WoS full record; |
| van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
Defect related growth of tabular AgCl(100) crystals: a TEM study |
1998 |
|
|
|
UA library record; WoS full record; |
| Van Tendeloo, G.; Hervieu, M.; Chaillout, C. |
Defect structure of Hg-based ceramic superconductors (invited) |
1994 |
Sciences |
|
|
UA library record; WoS full record; |
