Number of records found: 246
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Calculation of Debye-Waller temperature factors for GaAs”. Schowalter M, Rosenauer A, Titantah JT, Lamoen D, Springer proceedings in physics 120, 195 (2008)
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Crystalline and amorphous frameworks with giant pores: what information ca we expect from advanced TEM?”.Lebedev OI, Van Tendeloo G, Electron microscopy and multiscale modeling: proceedings of the AIP conference proceedings 999, 245 (2008)
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Domain coexistence of magnetism and superconductivity : appearance of confined vortex loops”. Doria MM, de Romaguera ARC, Milošević, MV, Peeters FM, Journal of physics : conference series 97, 012070 (2008). http://doi.org/10.1088/1742-6596/97/1/012070
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Dynamics of nanoclustering in Te+ implanted Si after application of high frequency electromagnetic field and thermal annealing”. Kalitzova M, Lebedev OI, Zollo G, Gesheva K, Vlakhov E, Marinov Y, Ivanova T;, Applied physics A : materials science &, processing 91, 515 (2008). http://doi.org/10.1007/s00339-008-4441-2
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Effect of temperature on the 002 electron structure factor and its consequence for the quantification of ternary and quaternary III-V crystals”. Titantah JT, Lamoen D, Schowalter M, Rosenauer A, Springer proceedings in physics 120, 189 (2008)
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Electrochemical growth and characterization of nanostructured ZnO thin films”. Ghica C, Enculescu I, Nistor LC, Matei E, Van Tendeloo G, Journal of optoelectronics and advanced materials 10, 3237 (2008)
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Formation of vortex clusters and giant vortices in mesoscopic superconducting disks with strong disorder”. Escoffier W, Grigorieva IV, Misko VR, Baelus BJ, Peeters FM, Vinnikov LY, Dubnos S, Journal of physics : conference series 97, 012172 (2008). http://doi.org/10.1088/1742-6596/97/1/012172
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The influence of the secondary electron emission coefficient and effect of the gas heating on the calculated electrical characteristics of a grimm type glow discharge cell”. Derzsi A, Donko Z, Bogaerts A, Hoffmann V, , 285 (2008)
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Modeling of a dielectric barrier discharge used as a flowing chemical reactor”. Petrovic D, Martens T, van Dijk J, Brok WJM, Bogaerts A, , 262 (2008)
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Real time path integrals in studies of quantum dots dynamics: non-monotonous decay rate and reappearance of rabi rotations”. Vagov A, Croitoru MD, Axt VM, Kuhn T, Peeters F, Path Integrals : New Trends and Perspectives, Proceedings , 57 (2008). http://doi.org/10.1142/9789812837271_0007
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Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam”. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy 231, 359 (2008). http://doi.org/10.1111/j.1365-2818.2008.02055.x
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Revealing nanoscale structural TEM/HRTEM: application on ferroelectric ordering by PMN-PT relaxor ferroelectric”. Ghica C, Nistor L, Van Tendeloo G, Journal of optoelectronics and advanced materials 10, 2328 (2008)
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Sputtering of Si(001) and SiC(001) by grazing ion bombardment”. Elmonov AA, Yusupov MS, Dzhurakhalov AA, Bogaerts A, , 209 (2008)
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Superconductivity in the quantum-size regime”. Shanenko AA, Croitoru MD, Peeters FM, , 79 (2008)
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Temperature and magnetic field dependence of the voltagein GaAs films with superconducting Ga grains”. Willems BL, Taylor DMJ, Fritzsche J, Malfait M, Vanacken J, Moshchalkov VV, Montoya E, Van Tendeloo G, European physical journal : B : condensed matter and complex systems 66, 25 (2008). http://doi.org/10.1140/epjb/e2008-00386-3
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Tuning of the optical properties of (11k) grown InAs quantum dots by the capping layer”. Mlinar V, Peeters FM, Microelectronics journal 39, 359 (2008). http://doi.org/10.1016/j.mejo.2007.07.052
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A versatile plasma tool for the synthesis of carbon nanotubes and few-layer graphene sheets”. Malesevic A, Kemps R, Zhang L, Erni R, Van Tendeloo G, Vanhulsel A, van Haesendonck C, Journal of optoelectronics and advanced materials 10, 2052 (2008)
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Euroanalysis 14: the European Conference on Analytical Chemistry”. Janssens K, van Espen P, Van 't dack L, Analytical and bioanalytical chemistry 391, 1107 (2008). http://doi.org/10.1007/S00216-008-2114-9
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DART explained: how to carry out a discrete tomography reconstruction”. Batenburg KJ, Bals S, Sijbers J, Van Tendeloo G, , 295 (2008)
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Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals”. Lisiecki I, Turner S, Bals S, Pileni MP, Van Tendeloo G Springer, Berlin, page 273 (2008).
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Functional imaging to predict treatment success of mandibular advancement devices in sleep-disordered breathing”. de Backer J, Vanderveken O, Vos W, Devolder A, Verhulst S, Verbraecken J Antwerpen, page 141 (2008).
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Modeling of the magnetron discharge”. Bogaerts A, Kolev I, Buyle G Springer, Berlin, page 61 (2008).
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The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
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Een tweede leven voor broeikasgassen?”.Paulussen S, Sels B, Bogaerts A, Paul J, Het ingenieursblad : maandblad van de Koninklijke Vlaamse Ingenieursvereniging KVIV 77, 16 (2008)
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The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data”. Van Aert S, Bals S, Chang LY, den Dekker AJ, Kirkland AI, Van Dyck D, Van Tendeloo G Springer, Berlin, page 97 (2008).
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2θ-resolution obtainable during – XRPD experiments at Beamline L”. de Nolf W, Jaroszewicz J, Janssens K, Falkenberg G page 1655 (2008).
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Analiza pierwiastkowa zabytkowych obiektów szklanych”. Wagner B, Nowak A, Bulska E, Kunicki-Goldfinger J, Schalm O, Janssens K, Nauka i Zabytki , 71 (2008)
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Assessing the origin and fate of Cr, Ni, Cu, Zn, Pb, and V in an industrial polluted soil by combined micro-spectroscopic techniques and bulk extraction methods”. Terzano R, Spagnuolo M, Vekemans B, de Nolf W, Janssens K, Falkenberg G, Fiore S, Ruggiero P (2008).
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Characterization of Yenisey River U-particles using a combination of μ-XRF, μ-XRD and U-LIII μ-XANES”. Lind OC, Claussen-Kjerre L, de Nolf W, Falkenberg G, Jaroszewicz J, Janssens K, Salbu B page 1279 (2008).
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Combined micro-XRF/XRPD tomography on historical and modern paint multilayer samples at Beamline L”. de Nolf W, Jaroszewicz J, van der Snickt G, Janssens K, Farnell S, Klaassen L page 1633 (2008).
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