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Records |
Links |
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Author |
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
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Title |
Absorption correction in electron probe x-ray microanalysis of thin samples |
Type |
A1 Journal article |
| |
Year |
1986 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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| |
Volume |
58 |
Issue |
7 |
Pages |
1282-1285 |
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| |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
A1986C594100007 |
Publication Date |
2005-03-08 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0003-2700; 5206-882x |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited  |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:116524 |
Serial |
7409 |
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| Permanent link to this record |
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Author |
Markowicz, A.; Raeymaekers, B.; Van Grieken, R.; Adams, F. |
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Title |
Analytical electron microscopy of single particles |
Type |
H3 Book chapter |
| |
Year |
1986 |
Publication |
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Abbreviated Journal |
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| |
Volume |
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Issue |
|
Pages |
173-197
T2 - Physical and chemical characterizatio |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:117504 |
Serial |
7455 |
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| Permanent link to this record |
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Author |
Markowicz, A.A.; Van Grieken, R.E. |
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| |
Title |
Atomic number correction in electron probe X-ray microanalysis of curved samples and particles |
Type |
A1 Journal article |
| |
Year |
1984 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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| |
Volume |
56 |
Issue |
14 |
Pages |
2798-2801 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Place of Publication |
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Wos |
A1984TU34600040 |
Publication Date |
2005-03-08 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
|
Edition |
|
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| |
ISSN |
0003-2700; 5206-882x |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116519 |
Serial |
7535 |
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| Permanent link to this record |
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Author |
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
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| |
Title |
Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal |
Type |
A1 Journal article |
| |
Year |
1980 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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| |
Volume |
9 |
Issue |
2 |
Pages |
70-76 |
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| |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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| |
Abstract |
A method has been investigated which allows calculations from the X-ray fluorescence spectra of the absorption coefficients at any energy for any sample, without any additional measurement. Use is made of the ratio of the characteristic X-ray signals from a Zr wire positioned in front of the sample and from a Pd foil placed behind the sample, both in a fixed geometry. From the experimentally measured absorption coefficient at the Pd L energy (2.9 keV), the coefficients for higher energies are calculated. By the use of an iterative computer routine in which corrections for the enhancement of the Pd foil by the sample are also included, an accuracy of 2% or better on the absorption coefficient determination can be reached for homogenous samples in one measurement. Grain-size and heterogeneity effects induce inaccuracies on the absorption coefficient determinations which might well reach 20% for particulate samples like intermediate thickness deposits of geological materials. This approach thus has the same limitations as the classical transmission method for such heterogeneous samples. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1980JN16500007 |
Publication Date |
2005-05-28 |
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Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
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| |
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116483 |
Serial |
7541 |
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| Permanent link to this record |
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Author |
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
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| |
Title |
Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films |
Type |
A1 Journal article |
| |
Year |
1985 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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|
| |
Volume |
57 |
Issue |
14 |
Pages |
2885-2889 |
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| |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1985AVD0100033 |
Publication Date |
2005-03-08 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
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| |
ISSN |
0003-2700; 5206-882x |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:113616 |
Serial |
7567 |
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| Permanent link to this record |
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Author |
Markowicz, A.A.; Van Grieken, R.E. |
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Title |
Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis |
Type |
A1 Journal article |
| |
Year |
1984 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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|
| |
Volume |
56 |
Issue |
12 |
Pages |
2049-2051 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1984TL48800021 |
Publication Date |
2005-03-08 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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| |
ISSN |
0003-2700; 5206-882x |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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| |
Impact Factor |
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Times cited |
|
Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116518 |
Serial |
7704 |
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| Permanent link to this record |
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Author |
Van Grieken, R.; Markowicz, A.; Veny, P. |
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Title |
Current trends in the literature on X-ray emission spectrometry |
Type |
A1 Journal article |
| |
Year |
1991 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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| |
Volume |
20 |
Issue |
|
Pages |
271-276 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1991HC15900003 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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| |
Series Volume |
|
Series Issue |
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Edition |
|
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| |
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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| |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:665 |
Serial |
7746 |
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| Permanent link to this record |
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Author |
Van Grieken, R.; Markowicz, A.; Török, S. |
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Title |
Energy-dispersive X-ray spectrometry : present state and trends |
Type |
A3 Journal article |
| |
Year |
1986 |
Publication |
Fresenius' Zeitschrift für analytische Chemie |
Abbreviated Journal |
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| |
Volume |
324 |
Issue |
8 |
Pages |
825-831 |
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| |
Keywords |
A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
| |
Abstract |
Recent development, present state and expected future developments in energy-dispersive X-ray spectrometry are discussed. Attention is paid to the improvements in analytical selectivity, sensitivity, detection limit, quantitative character and applicability range, which are the result of new or better excitation sources, detectors, instrument design, automation, computer software and theoretical developments. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2004-11-15 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
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ISSN |
0016-1152 |
ISBN |
|
Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116642 |
Serial |
7907 |
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| Permanent link to this record |
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Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
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| |
Title |
Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples |
Type |
A1 Journal article |
| |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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|
| |
Volume |
15 |
Issue |
2 |
Pages |
131-133 |
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| |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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| |
Abstract |
A new equation for predicting the generated bremsstrahlung background intensity in electron-probe x-ray microanalysis has been verified experimentally. This equation is applicable to all bulk composite specimens and reduces to Kramers' equation for pure elements only. The experimental verification has been carried out for Al2O3, Fe2O3 and ZrO2 with radiation energies from 4.2 to 14.8 keV. The predicted bremsstrahlung intensities are in good agreement with the experimental data. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1986C017300009 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:113873 |
Serial |
7937 |
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| Permanent link to this record |
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Author |
Van Grieken, R.E.; Markowicz, A.A. |
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Title |
Handbook of X-ray spectrometry |
Type |
ME2 Book as editor or co-editor |
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Year |
2002 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1016 p. |
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Keywords |
ME2 Book as editor or co-editor; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
2 ed. |
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ISSN |
|
ISBN |
0-8247-0600-5 |
Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:36390 |
Serial |
8017 |
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| Permanent link to this record |
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Author |
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
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Title |
Influence of sample thickness, excitation energy and geometry on particle size effects in XRF |
Type |
A1 Journal article |
| |
Year |
1985 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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| |
Volume |
14 |
Issue |
4 |
Pages |
183-187 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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| |
Abstract |
Expressions are presented for calculating the matrix effect and the pure particle size effect in the XRF analysis of particulate samples with a discrete particle size. The equations are based on the absorption-weighted radiometric diameter concept. Two excitationdetection geometries are considered, with the angles between the sample plane and both the incident and emerging radiation being either 90° (π geometry) or 45° (π/2 geometry). Calculations were made for different sample loadings and exciting radiation energies. The influence of these parameters on the matrix and pure particle size effects is shown. From the results, it is possible to predict the performances of alternative experimental correction procedures for the particle size effect, involving dual measurements at different excitation energies or in different excitationdetection geometries. |
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Address |
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Corporate Author |
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Thesis |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1985ATB6100007 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116486 |
Serial |
8097 |
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| Permanent link to this record |
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| |
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Author |
Markowicz, A.A.; Van Grieken, R.E. |
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Title |
Quantification in XRF analysis of intermediate-thickness samples |
Type |
H3 Book chapter |
| |
Year |
2002 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
|
Pages |
407-431
T2 - Handbook of X-ray spectrometry / Grie |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:36389 |
Serial |
8433 |
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| Permanent link to this record |
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| |
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Author |
Markowicz, A.M.; Van Grieken, R.E. |
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Title |
Quantification in XRF analysis of intermediate-thickness samples |
Type |
H3 Book chapter |
| |
Year |
1992 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
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Issue |
|
Pages |
339-358
T2 - Handbook of X-ray spectroscopy / Grie |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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| |
Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:2855 |
Serial |
8434 |
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| Permanent link to this record |
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| |
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Author |
Markowicz, A.; Van Dyck, P.; Van Grieken, R. |
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| |
Title |
Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis |
Type |
A1 Journal article |
| |
Year |
1980 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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| |
Volume |
9 |
Issue |
2 |
Pages |
52-56 |
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| |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
| |
Abstract |
In X-ray fluorescence analysis the concept of radiometric diameter, d, is often introduced in considerations of the fluorescent intensity from a particulate sample. It represents the mean geometric path of the X-rays through one particle and is usually simply taken to be equal to the volume-to-area ratio of the particle. The effective radiometric path is, however, itself dependent on geometry and absorption effects. Rigorous calculations of the fluorescent intensity from a particle in the π and π/2 geometries were carried out to evaluate the errors involved. It appears that, for π geometry, the discrepancy between these exact results and the intensity calculated via the use of d does not exceed 5.2%. For the π/2 geometry, the errors are much larger and can amount to 50% in realistic cases of X-ray fluorescence analysis. These conclusions are also applicable to monolayers. The effective radiometric diameter approaches d only when absorption effects become negligible, but is smaller in other cases. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1980JN16500003 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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| |
ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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| |
Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116482 |
Serial |
8451 |
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| Permanent link to this record |
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| |
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Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
|
| |
Title |
A simple absorption correction for electron probe X-ray microanalysis of bulk samples |
Type |
A1 Journal article |
| |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
|
| |
Volume |
15 |
Issue |
2 |
Pages |
115-119 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages. |
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Wos |
A1986C017300007 |
Publication Date |
2005-05-28 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:113872 |
Serial |
8524 |
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| Permanent link to this record |
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Author |
Markowicz, A.A.; Van Grieken, R.E. |
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Title |
X-ray spectrometry |
Type |
A1 Journal article |
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Year |
1990 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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| |
Volume |
62 |
Issue |
12 |
Pages |
101r-113r |
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| |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2006-11-06 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0003-2700; 5206-882x |
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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| |
Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116527 |
Serial |
8779 |
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| Permanent link to this record |
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Author |
Markowicz, A.A.; Van Grieken, R.E. |
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Title |
X-ray spectrometry |
Type |
A1 Journal article |
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Year |
1988 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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Volume |
60 |
Issue |
12 |
Pages |
28r-42r |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2005-03-08 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0003-2700; 5206-882x |
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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| |
Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116525 |
Serial |
8780 |
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| Permanent link to this record |
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Author |
Markowicz, A.A.; Van Grieken, R.E. |
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Title |
X-ray spectrometry |
Type |
A1 Journal article |
| |
Year |
1986 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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| |
Volume |
58 |
Issue |
5 |
Pages |
279r-294r |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2005-03-08 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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| |
Series Volume |
|
Series Issue |
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Edition |
|
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ISSN |
0003-2700; 5206-882x |
ISBN |
|
Additional Links |
UA library record |
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| |
Impact Factor |
|
Times cited |
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Open Access |
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| |
Notes |
|
Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116523 |
Serial |
8781 |
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| Permanent link to this record |
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Author |
Markowicz, A.A.; Van Grieken, R.E. |
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Title |
X-ray spectrometry |
Type |
A1 Journal article |
| |
Year |
1984 |
Publication |
Reviews in analytical chemistry |
Abbreviated Journal |
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Volume |
56 |
Issue |
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Pages |
241r-250r |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
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ISSN |
0048-752x |
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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| |
Notes |
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Approved |
no |
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| |
Call Number |
UA @ admin @ c:irua:116709 |
Serial |
8782 |
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| Permanent link to this record |
